Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Device and method for detecting substrate

A substrate inspection and substrate technology, applied in the field of inspection, can solve problems such as waste of production costs, affecting product quality, etc., and achieve the effect of reducing waste

Inactive Publication Date: 2015-04-29
BOE TECH GRP CO LTD +1
View PDF7 Cites 14 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

If a defective or cracked substrate is used for production, it will inevitably affect the quality of the product, and it will also cause waste of production costs

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Device and method for detecting substrate
  • Device and method for detecting substrate
  • Device and method for detecting substrate

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0035] In order to accurately and quickly detect whether there is a defect in the substrate, thereby effectively controlling product quality and reducing waste of production costs, embodiments of the present invention provide a substrate detection device and method. In the technical solution of the embodiment of the substrate detection device, the line source light emitting device emits incident light to the substrate at a set incident angle, and the incident light can scan the surface of the substrate with the relative movement between the line light source light emitting device and the substrate; the reflected light receiving device is It is set to receive the reflected light corresponding to the incident light directed at the standard plane of the substrate, and can send out a defect alarm signal of the substrate when the actual receiving area of ​​the reflected light is inconsistent with the standard receiving area. When there are defects such as incomplete or cracked subst...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a device and a method for detecting a substrate. Whether defects exist on the substrate can be accurately and rapidly detected, so that the quality of the product can be effectively managed and controlled and the waste of the production cost is reduced. The device for detecting the substrate comprises a line source light-emitting device and a reflected light receiving device, wherein the line source light-emitting device sends out an incident light to the substrate at a set incident angle; the incident light scans the surface of the substrate along with relative movement of the line source light-emitting device and the substrate; and the reflected light receiving device is used for receiving the reflected light corresponding to the incident light which emits towards a standard plane of the substrate, and sending out a substrate defect alarm signal when an actual receiving zone of the reflected light is inconsistent with a standard receiving zone.

Description

technical field [0001] The invention relates to the technical field of detection, in particular to a substrate detection device and method. Background technique [0002] At present, during the production of flat panel display devices, many sealed and continuous production equipment are not equipped with a substrate inspection link. If a defective or cracked substrate is used for production, it will inevitably affect the quality of the product and cause waste of production costs. Contents of the invention [0003] The purpose of the embodiments of the present invention is to provide a substrate inspection device and method to accurately and quickly detect whether there is a defect in the substrate, thereby effectively controlling product quality and reducing waste of production costs. [0004] An embodiment of the present invention provides a substrate detection device, including a line light source light emitting device and a reflected light receiving device, wherein: ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01N21/88
Inventor 李发顺崔富毅白雪飞阮士薪
Owner BOE TECH GRP CO LTD
Features
  • Generate Ideas
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com