Embodiments of the present application provide a kind of
undercut structure measurement method and
undercut structure measurement
system, it is related to display field, to accurately measure the width of
undercut area in undercut structure in line.
Undercut structure measurement method includes: applying vibration to the carrying substrate of carrying substrate with to be measured substrate, wherein, to be measured substrate includes undercut structure, undercut structure has undercut slot, undercut structure includes
solid area and undercut area, undercut slot is located in undercut area;Control
light source emits detection light towards to be measured substrate, and the relative position relationship between control
light source and carrying substrate is changed, to make detection
light scan to be measured substrate along first path, wherein, first path at least passes through the first edge of undercut structure and first boundary, first boundary is the boundary of undercut area and
solid area, and first boundary is opposite to first edge;Control probe receives the detection light reflected back by to be measured substrate;According to the path of reflection
light spot received by probe, the width of undercut area is obtained.