Test method of thin-film battery micro-short circuit

Abstract

The invention discloses a test method of a thin-film battery micro-short circuit. The test method comprises the following steps that firstly, a backward voltage is applied to the positive electrode and the negative electrode of a thin-film battery for 800 ms to 5 s; secondly, an infrared imaging device is used for observing the thin-film battery to which the voltage is applied; thirdly, the micro-short circuit gives off heat due to current passing, different states can be displayed in the infrared imaging device, and therefore the micro-short circuit position can be accurately found. By means of the test method, the micro-short circuit position can be quickly and accurately found when a micro-short circuit occurs, and the test method indicates directions for technology improving.

Description

technical field [0001] The invention relates to a method for testing the micro-short circuit of a thin film battery. Background technique [0002] In the production process of thin-film solar cells, due to the production environment, production equipment, raw materials and other reasons, it is easy to have micro-short circuit of the battery. [0003] At present, the monitoring of the production process of thin-film solar cells, especially the monitoring of electrical performance parameters, mainly depends on the I-V tester. According to the results of the I-V test and the research on the production process, a preliminary judgment can be made on the electrical performance degradation caused by the micro-short circuit. The location cannot give a clear result, which will cause trouble for subsequent improvement work. Contents of the invention [0004] The purpose of the present invention is to provide a testing method capable of quickly and accurately finding the location of...

AI Technical Summary

Problems solved by technology

[0002] In the production process of thin-film solar cells, due to the production environment, production equipment, raw materials and other reasons, it is easy to have micro-short circuit phenomenon of the battery.

[0003] At present, the monitoring of the production process of thin-film solar cells, especially the monitoring of electrical performance parameters, mainly depends on the I-V tester. According to the results of the I-V test and the research on the production process, a preliminary judgment can be made on the electrical performance degradation caused by the micro-short circuit. The location cannot give a clear result, which will cause trouble for the follow-up improvement work