Gemological microscope for measuring surface refractive index of gem
A technology of refractive index and microscopy, which is applied in the field of gemstone microscopes, can solve problems such as measuring refractive index, and achieve the effect of avoiding interference
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[0007] The purpose of the present invention is to provide a gem microscope for measuring the refractive index of the gem surface to solve the problem in the prior art that the refractive index of the observed point cannot be measured while observing the gem surface situation
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[0024] The technical solution will be described in detail below in conjunction with the embodiments and the accompanying drawings.
[0025] As shown in the figure, a gem microscope for measuring the refractive index of a gem surface includes an observation lens 1, an adjustment fixing seat 2, a bottom light source 3, a side light source 4, a beam splitter 5, a housing 6, a measurement light source 7, and a converging lens 8. Prism 9, jewel clip 10, light shield and aperture 11, detector 12, wherein the observation lens adopts all observation lenses of ordinary gem microscopes, including objective lens and eyepiece; the adjustment fixing seat includes bracket and focusing mechanism; Side trapezoidal cylinder, except for the two trapezoidal surfaces, the other four sides of the prism are rectangular and polished. The gemstone clip is the gemstone clip used in ordinary gemstone microscopes. The measuring light source, long working distance objective lens, prism, light shield and d...
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Abstract
The invention relates to a gemological microscope for measuring the surface refractive index of a gem. The gemological microscope comprises an observation lens 1, an adjusting permanent seat 2, a bottom light source 3, a lateral light source 4, a spectroscope 5, a housing 6, a measuring light source 7, a converging lens 8, a prism 9, a gem clip 10, a lens hood and a diaphragm 11 and a detector 12, wherein the observation lens is an overall observation lens of a common gemological microscope, including an objective lens and an eyepiece. The gemological microscope provided by the invention is placed in the closed housing, so that the interference on measurement of refractive index by environmental light in an observation process is reduced, the gem can be observed in a transmitting or reflecting manner, and the real-time refractive index at the observation point is measured. A loading platform and the prism are designed, so that the damage on the prism or a sample by friction between the prism and the gem in the observation process is avoided. According to an orthogonal design of an observation light path and a refractive index measurement light path and use of the lens hood and the diaphragm, interference on the refractive index measurement by the observation light source is avoided.
Description
technical field [0001] The invention relates to the technical field of gemstone measuring instruments, in particular to a gemstone microscope used for measuring the refractive index of gemstone surfaces. Background technique [0002] Gemstone measurement is an essential step in gemstone processing and evaluation, and gemstone refractive index is an important index to measure gemstone texture and processing level. In the prior art, special gemstone microscopes are generally used for gemstone observation. The refractive index is measured by a dedicated gemstone refractometer. The separate use of the above two instruments leads to asynchronous observation and refractive index measurement. It is difficult to obtain accurate data on the visual situation and refractive index of a certain point on the gemstone surface. [0003] Chinese patent, a jewel refractometer (application number: 200910098701.2, 200920120031.5, application for invention and utility model at the same time), pr...
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IPC IPC(8): G01N21/43G01N21/87
Inventor 叶青孙腾骞王槿邓志超张春平田建国