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Embedded machine vision inspection program development method and system

A technology of machine vision detection and program development, applied in the direction of program control devices, etc., can solve problems such as limited scope of use, excessive energy, and cost of developers, and achieve the effect of avoiding language barriers and standardizing programs

Active Publication Date: 2015-09-09
JIANGNAN UNIV
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Problems solved by technology

However, embedded development programs, such as FPGA, DSP, etc., have greatly limited their scope of use due to their complex structure and difficulty in function realization. The program is also prone to some defects that cannot be detected during development, which will directly affect the accuracy of the detection results in severe cases

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  • Embedded machine vision inspection program development method and system
  • Embedded machine vision inspection program development method and system
  • Embedded machine vision inspection program development method and system

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Embodiment Construction

[0042] In order to make the objectives, technical solutions and advantages of the present invention clearer, the following further describes the present invention in detail in conjunction with specific embodiments.

[0043] First, with reference to the accompanying drawings, an embodiment of the development of an embedded machine vision inspection program provided by the present invention is introduced.

[0044] figure 1 This is a schematic diagram of the overall flow of an embodiment of an embedded machine vision inspection program development method provided by the present invention. As shown in the figure, an embedded machine vision inspection program development method provided by the present invention includes the following steps:

[0045] S1. Obtain input parameters and steps required to perform the machine vision inspection function.

[0046] S2, selecting a machine vision inspection file in the database according to the input parameters and steps.

[0047] S3, using the input p...

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Abstract

The invention discloses an embedded machine vision inspection program development method and system, wherein the method comprises the following steps: obtaining input parameters and procedures required for the execution of machine vision inspection function; selecting machine vision inspection documents in a database according to the input parameters and procedures; replacing parameters to be determined in the machine vision inspection documents with the input parameters; arranging the execution sequence of the machine vision inspection documents according to the procedures; packaging the machine vision inspection documents into the embedded machine vision inspection program according to the execution sequence. The embedded machine vision inspection program development method and system provided by the invention avoid the inspection system development obstacles and ensure that the developed program is standardized and normalized.

Description

Technical field [0001] The invention relates to the field of embedded program development for automatic detection, in particular to an embedded machine vision detection program development method and system. Background technique [0002] Nowadays, the cost of production labor is getting higher and higher, and workers’ requirements for the comfort and labor intensity of the working environment are gradually increasing. The inspection process in the industrial field is increasingly adopting machine vision inspection solutions, that is, using certain image acquisition The equipment photographs the detection target, uses image processing methods for analysis, and automatically outputs the detection result. The use of machine vision detection solutions can effectively reduce the labor intensity of workers, and at the same time can improve the accuracy of detection. [0003] In recent years, in the research of machine vision inspection, the embedded inspection scheme has received more a...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F9/44
Inventor 潘如如高卫东周建
Owner JIANGNAN UNIV
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