Image generating device, defect inspecting device, and defect inspecting method

An image generation device and image generation technology, which are applied in image enhancement, image analysis, measurement devices, etc., can solve problems such as undetectable defects and limited defect detection capabilities, and achieve the effect of preventing repeated detection and high detection capabilities.

Active Publication Date: 2015-09-30
SUMITOMO CHEM CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

As mentioned above, defects are sometimes undetectable due to their location
Therefore, the defect inspection device of the above-mentioned first prior art for inspecting defects of sheet-shaped molded objec

Method used

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  • Image generating device, defect inspecting device, and defect inspecting method
  • Image generating device, defect inspecting device, and defect inspecting method
  • Image generating device, defect inspecting device, and defect inspecting method

Examples

Experimental program
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Example Embodiment

[0068] Figure 1A And 1B is a process chart showing the procedure of the defect inspection method of one embodiment of the present invention. The defect inspection method of this embodiment includes Figure 1A The transmission step s1, the light irradiation step s2, the imaging step s3, the feature amount calculation step s4, the processed image data generation step s5, the defect map image generation step s6, and the display step s7 are shown. In addition, the defect map image generation step s6 includes Figure 1B The defect map image coordinate value calculation step s6-1, the accumulation step s6-2, and the brightness value setting step s6-3 are shown.

[0069] figure 2 It is a schematic diagram showing the structure of the defect inspection apparatus 100 of an embodiment of this invention. image 3 It is a block diagram showing the structure of the defect inspection apparatus 100. The defect inspection apparatus 100 of the present embodiment is an apparatus that detects def...

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Abstract

A defect map image generating unit (72) of a defect inspecting device (100) generates a defect map image by combining a plurality of processed images generated by a processed image generating unit (61). The defect map image generating unit (72) has a coordinate calculating unit (721), an integrating unit (722), and a brightness setting unit (723). The coordinate calculating unit (721) calculates the coordinates of each pixel in the defect map image on the basis of the coordinates of each pixel in each processed image, the transport speed of a sheet body (2), and the frame rate set in the imaging device (5). The integrating unit (722) finds the number of defective pixels from among the pixels that had the same coordinates calculated by the coordinate calculating unit (721) and the total of gradation values in the defective pixel. The brightness setting unit (723) sets the brightness for each pixel in the defect map image according to the calculated value by the integrating unit (722).

Description

technical field [0001] The present invention relates to an image generation device for generating image data for inspecting defects of sheet-shaped molded articles such as polarization filters and retardation films, a defect inspection device and a defect inspection method including the image generation device. Background technique [0002] As a first conventional defect inspection device for inspecting defects of sheet-shaped molded articles such as polarization filters and retardation films, there is a device using a one-dimensional camera called a line sensor. Figure 12A And 12B is a figure explaining the operation|movement at the time of generating defect map image L using the one-dimensional images K1-K19 acquired by the line sensor in the defect inspection apparatus of the 1st prior art. [0003] The defect inspection device of the first prior art illuminates the sheet-shaped molded object with a linear light source such as a fluorescent tube, and the line sensor illum...

Claims

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Application Information

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IPC IPC(8): G01N21/892G01B11/30
CPCG06T2207/30124G01N21/892G01N2021/8861G06T7/0004
Inventor 尾崎麻耶
Owner SUMITOMO CHEM CO LTD
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