Image generating device, defect inspecting device, and defect inspecting method

Abstract

A defect map image generating unit (72) of a defect inspecting device (100) generates a defect map image by combining a plurality of processed images generated by a processed image generating unit (61). The defect map image generating unit (72) has a coordinate calculating unit (721), an integrating unit (722), and a brightness setting unit (723). The coordinate calculating unit (721) calculates the coordinates of each pixel in the defect map image on the basis of the coordinates of each pixel in each processed image, the transport speed of a sheet body (2), and the frame rate set in the imaging device (5). The integrating unit (722) finds the number of defective pixels from among the pixels that had the same coordinates calculated by the coordinate calculating unit (721) and the total of gradation values in the defective pixel. The brightness setting unit (723) sets the brightness for each pixel in the defect map image according to the calculated value by the integrating unit (722).

Description

technical field [0001] The present invention relates to an image generation device for generating image data for inspecting defects of sheet-shaped molded articles such as polarization filters and retardation films, a defect inspection device and a defect inspection method including the image generation device. Background technique [0002] As a first conventional defect inspection device for inspecting defects of sheet-shaped molded articles such as polarization filters and retardation films, there is a device using a one-dimensional camera called a line sensor. Figure 12A And 12B is a figure explaining the operation|movement at the time of generating defect map image L using the one-dimensional images K1-K19 acquired by the line sensor in the defect inspection apparatus of the 1st prior art. [0003] The defect inspection device of the first prior art illuminates the sheet-shaped molded object with a linear light source such as a fluorescent tube, and the line sensor illum...

AI Technical Summary

Problems solved by technology

As mentioned above, defects are sometimes undetectable due to their location

Therefore, the defect inspection device of the above-mentioned first prior art for inspecting defects of sheet-shaped molded objects using a two-dimensional image composed of a plurality of one-dimensional images K1 to K19 acquired by a line sensor, that is, a defect map image L, has limited capabilities. defect detection capabilities

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