Test sorter and electronic component testing method using the same

Abstract

A test handler is disclosed. The test handler comprises: a loading unit which allows electronic components to sequentially circulate on a predetermined path including a loading position, a test position, and an unloading position and to be tested, classifies the electronic components by rating according to the test result, and in which the electronic components are loaded; a test support unit in which the loading-completed electronic components are tested; an unloading unit in which the test-completed electronic components are classified by rating and unloaded; and a control unit which controls the loading unit, the test support unit, and the unloading unit, and discharges the unloaded electronic components, wherein the control unit loads, when loading of electronic components corresponding to a first lot tested first is completed, at least a part of the electronic components corresponding to a second lot are tested later than the first lot.

Description

technical field [0001] The invention relates to a testing and sorting machine and an electronic component testing method using the testing and sorting machine. Background technique [0002] Manufactured electronic parts (for example, semiconductor elements) are tested by an inspection device called a test handler. The test sorter may sort the electronic components into grades according to the test results after performing tests on the electronic components. [0003] figure 1 It is a diagram showing a general test handler 10 . As shown in the figure, the test sorting machine 10 may include: a loading part 11, which is used to load the electronic components once loaded on the customer tray (customer tray) into the test tray (test tray) at the loading position; a soaking chamber 12, Preheat or precool the electronic components to adapt to various environmental conditions; the test support unit 13 supports the electronic components to be tested by the testing machine 20; the ...

AI Technical Summary

Problems solved by technology

[0012] Among them, there may be a problem that the order in which a pair of test trays 1 that are simultaneously tested is transferred from the soaking chamber 12 to the test support 13 is not the same as the order in which the pair of test trays 1 are transferred from the test support 13 to the soaking chamber. The order of 14 may be reversed

[0014] As mentioned above, electronic components are not only produced in batches, but also demanders differ according to the batches. If the order of the batches is reversed as mentioned above, it may cause problems in various aspects.

[0015] In the prior art, although two batches are distinguished by inserting an empty test tray between the front batch and the rear batch, it has the problem of reducing the test efficiency, and although it has also been tried Forcibly changing the position between a pair of test trays located at the junction of two batches, but because of the need for a special mechanical structure, it leads to problems such as space limitations and increased costs.

Images