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Compatibility compression method between grouped test vectors based on test pattern reordering

A test vector and test mode technology, applied in the field of data compression, can solve problems such as low compatibility, achieve the effect of good compression rate and increase compression rate

Active Publication Date: 2017-12-12
上海前瞻创新研究院有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

But between reordered test vectors, their compatibility is still low

Method used

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  • Compatibility compression method between grouped test vectors based on test pattern reordering
  • Compatibility compression method between grouped test vectors based on test pattern reordering

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Embodiment Construction

[0021] The embodiments of the present invention are described in detail below. This embodiment is implemented on the premise of the technical solution of the present invention, and detailed implementation methods and specific operating procedures are provided, but the protection scope of the present invention is not limited to the following implementation example.

[0022] The feature of the patent of the present invention is to consider the reordering of the test pattern after the compressed test vectors, and then divide the reordered test vectors into equal groups, so that the completely incompatible test vectors after the reordering can be grouped to be approximately compatible Effect. Here, the degree of correlation between any two columns of the test vector is first quantified, and this degree of correlation determines the probability of a jump between the two columns of test patterns.

[0023] The specific steps of encoding and compressing the compatibility compression ...

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Abstract

The invention discloses a compatibility compression method between grouped test vectors based on test pattern reordering. The compressed test vectors are reordered in test patterns, and then the reordered test vectors are equally divided into groups, so that After reordering, the completely incompatible test vectors are grouped to achieve approximate compatibility, and then the test vectors are further compressed. Compared with the prior art, the present invention has the following advantages: this scheme does not need a large decompression circuit structure, and then considers the test data compression of the compatibility between the group test vectors after the test data is reordered, so that the test data between the group test vectors is utilized Compatibility to compress the reordered test vectors can better increase the compression rate of test data.

Description

technical field [0001] The invention relates to an integrated circuit testing technology, in particular to a data compression method. Background technique [0002] With the continuous development of modern technology, the scale of integrated circuits IC is also increasing. Today, it has developed into a Very Large Scale Integrated Circuits (VLSI) circuit that can accommodate more than one billion transistors in an IC. and is still growing. Gordon Moore, one of the founders of Intel (Intel), proposed Moore's Law in 1965. Its content is: when the price remains unchanged, the number of transistors that can be accommodated on an IC will double approximately every 18 months. Performance will also be doubled. Some experts also believe that the feature size of transistors on ICs decreases at a rate of about 10.5% per year, which leads to an increase in the density of transistors at a rate of about 22.1% per year. This indicates that while the circuit function is becoming more an...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28
Inventor 詹文法赵士钰何姗姗
Owner 上海前瞻创新研究院有限公司