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On-chip measurement circuit and measurement method

An on-chip measurement and circuit technology, applied in the direction of measuring electrical variables, measuring electricity, measuring devices, etc., can solve the problem of not being able to determine the margin well

Active Publication Date: 2018-09-14
LOONGSON TECH CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The invention provides an on-chip measurement circuit and measurement method, which is used for the problem that the margin cannot be well determined in the prior art for the uncertainty range of the circuit to be tested

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  • On-chip measurement circuit and measurement method

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Embodiment Construction

[0022] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0023] The on-chip measurement circuit and measurement method provided by the embodiments of the present invention are used to track and capture some periodic signals in the on-chip circuit, and can record or count the changes of these periodic signals under the influence of chip fluctuations within a certain period of time, thereby obtaining the o...

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Abstract

Embodiments of the invention provide an on-chip measuring circuit and an on-chip measuring method. The on-chip measuring circuit comprises a sampling unit and a statistical unit, wherein the sampling unit is used for sampling periodic to-be-measured signals to obtain a sampled signal; and the statistical unit is used for counting distribution information of periodic level jump of the sampled signal obtained by the sampling unit through sampling. According to the on-chip measuring circuit and the on-chip measuring method, the to-be-measured signals are sampled to obtain the sampled signal, the distribution information of periodic level jump of the sampled signal is counted, periodic signals in an on-chip circuit can be tracked and captured, thereby a quantitative result of time uncertainty of critical signals in the on-chip circuit is obtained, and the quantitative result can be used as reference in the chip design and manufacturing processes, so as to determine a more appropriate margin.

Description

technical field [0001] The invention relates to chip technology, in particular to an on-chip measuring circuit and a measuring method. Background technique [0002] As fabrication dimensions shrink and supply voltages drop, circuit designs are increasingly subject to on-wafer fluctuations. On-Chip Variation (OCV for short) refers to the phenomenon that the actual value of each basic element on the chip deviates from the ideal value. The above-mentioned basic elements can include three main factors: process, voltage, and temperature. Among them: process fluctuation is due to the unideality of each step of the manufacturing process. The circuit obtained is not completely consistent with the design, resulting in the actual value of its parameters fluctuating within a certain range near the ideal design value. It is generally a one-off. Once Once manufactured, its deviation value is fixed; and fluctuations such as voltage and temperature are environmental fluctuations, which wi...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/3187
Inventor 杨梁郑睿
Owner LOONGSON TECH CORP