Method and device for obtaining sensitive cross section of single event effect device by using test data

Abstract

The invention provides a method and a device for acquiring the sensitive section of a single event effect device based on test data. The method comprises the following steps: using a predetermined radiation source to conduct a ground simulation experiment, acquiring an observation value Sigma(observation) of the sensitive section of the sensitive device, and monitoring the number N(end) of single event effect errors of the sensitive device in the experiment; performing a division operation on an observation value Sigma(LANSC) of the sensitive section of the sensitive device acquired through a neutron radiation source of the American Los Alamos laboratory and the observation value Sigma(observation) of the sensitive section of the sensitive device to get a first auxiliary factor; performing a division operation on a value Sigma(Rosetta) of the sensitive section of the sensitive device obtained through Rosetta real environment test and the observation value Sigma(observation) of the sensitive section of the sensitive device to get a second auxiliary factor; calculating the value of a correction factor according to the first auxiliary factor, the second auxiliary factor and the number of single event effect errors; and using the correction factor to correct an observation value Sigma(preset) of the sensitive section of the sensitive device. According to the invention, the sensitive section of an atmospheric neutron single event effect sensitive device in a real environment can be acquired to provide an important basis for protection and evaluation of airborne electronic equipment.

Description

technical field [0001] The invention relates to the technical field of microelectronics, in particular to a method and a device for obtaining a sensitive section of a single event effect device by using test data. Background technique [0002] There are high-energy atmospheric neutrons of 1MeV-1000MeV in the natural space environment, and airborne electronic equipment with complex microelectronic devices with storage structures will inevitably encounter about 300 neutrons per square centimeter per hour in the natural space environment with a flight altitude of 3000-20000 meters. ~18000 high-energy atmospheric neutrons of 1MeV~1000MeV produce single event effects, which affect the reliability of electronic equipment. Internationally, the sensitivity cross section is used to characterize the single event effect sensitivity characteristics of devices in neutron environments. However, at present, there is no sensitive cross-section data in the real environment in China, and the...

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Problems solved by technology

[0003] Domestically, the test source that can be used to carry out ground simulation tests is a 14MeV neutron radiation source. However, since this neutron source is a monoenergetic neutron source, the energy of neutrons in real environments is not monoenergetic. Therefore, using the current Some 14MeV neutron radiation sources have simulated tests on the sensitive cross section of the sensitive device and the sensitive cross section of the real environment sensitive device still has a certain error, which cannot be directly used to characterize the sensitive characteristics of the sensitive device in the real environment, which leads to It is impossible to accurately analyze the safety of sensitive components in airborne electronic equipment

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