Method and device for obtaining sensitive section of atmospheric neutron single event effect sensitive device
A single-event effect and sensitive cross-section technology, applied in the field of microelectronics, can solve the problems of inability to analyze the safety of sensitive devices, sensitive cross-section errors, and cannot be directly used to characterize the sensitive characteristics of sensitive devices, etc.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0037] In order to make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be described clearly and completely in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of the embodiments of the present invention, not all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.
[0038] Airborne electronic devices with microelectronic devices with complex storage structures will inevitably encounter high-energy atmospheric neutrons of about 300-18,000 1MeV-1000MeV per square centimeter per hour in the natural space environment at flying altitudes (3000-20000 meters). These high-energy neutrons will penetrate t...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com