Method and device for obtaining sensitive section of atmospheric neutron single event effect sensitive device

A single-event effect and sensitive cross-section technology, applied in the field of microelectronics, can solve the problems of inability to analyze the safety of sensitive devices, sensitive cross-section errors, and cannot be directly used to characterize the sensitive characteristics of sensitive devices, etc.

Active Publication Date: 2018-08-31
BEIJING SHENGTAOPING TEST ENG TECH RES INST
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  • Abstract
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  • Claims
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Problems solved by technology

[0003] Domestically, the test source that can be used to carry out ground simulation tests is a 14MeV neutron radiation source. However, since this neutron source is a monoenergetic neutron source, the energy of neutrons in real environments is not monoenergetic. Therefore, using the current Some 14MeV neutron radiation sources have simulated tests on the sensitive cross section of the sensitive device and the sensitive cross section of the real environment sensitive device still has a certain error, which cannot be directly used to characterize the sensitive characteristics of the sensitive device in the real environment, which leads to It is impossible to accurately analyze the safety of sensitive components in airborne electronic equipment

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  • Method and device for obtaining sensitive section of atmospheric neutron single event effect sensitive device
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  • Method and device for obtaining sensitive section of atmospheric neutron single event effect sensitive device

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Embodiment Construction

[0037] In order to make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be described clearly and completely in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of the embodiments of the present invention, not all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.

[0038] Airborne electronic devices with microelectronic devices with complex storage structures will inevitably encounter high-energy atmospheric neutrons of about 300-18,000 1MeV-1000MeV per square centimeter per hour in the natural space environment at flying altitudes (3000-20000 meters). These high-energy neutrons will penetrate t...

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Abstract

The invention provides a method and a device for acquiring the sensitive section of an atmospheric neutron single event effect sensitive device. The method comprises the following steps: using a predetermined radiation source to conduct a ground simulation experiment, acquiring an observation value Sigma(observation) of the sensitive section of the sensitive device under radiation of the predetermined radiation source, and monitoring the number N(end) of single event effect errors of the sensitive device in the simulation experiment; calculating the value Epsilon of a random error according to the number N(end) of single event effect errors and a preset sensitive section measurement accuracy requirement; calculating the value A of a correction factor according to a system error A0 of the predetermined radiation source in the simulation experiment and the value Epsilon of the random error; and correcting the observation value Sigma(observation) of the sensitive section of the sensitive device under radiation of the predetermined radiation source according to the value A of the correction factor. According to the invention, the sensitive section of an atmospheric neutron single event effect sensitive device in a real environment can be acquired to provide an important basis for protection and evaluation of airborne electronic equipment.

Description

Technical field [0001] The invention relates to the technical field of microelectronics, and in particular to a method and device for obtaining the sensitive cross section of an atmospheric neutron single event effect sensor. Background technique [0002] There are 1MeV~1000MeV high-energy atmospheric neutrons in the natural space environment. Airborne electronic equipment with complex storage structures of microelectronic devices will inevitably encounter about 300 per square centimeter per hour in a natural space environment with a flying altitude of 3000 to 20000 meters. ~18,000 1MeV~1000MeV high-energy atmospheric neutrons produce single event effects, thereby affecting the reliability of electronic equipment. Sensitive cross-sections are used internationally to characterize the single event sensitivity characteristics of devices in neutron environments. However, at present, there is no sensitive cross-section data under real environment in China, and the cost of flight test...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/265
Inventor 王群勇陈冬梅阳辉
Owner BEIJING SHENGTAOPING TEST ENG TECH RES INST
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