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USB (Universal Serial Bus) disk used for test

A USB interface, USB2.0 technology, applied in the field of U disk for testing, can solve the problems of many times of plugging and unplugging, time-consuming, troublesome testing process, etc., so as to avoid plugging and unplugging damage and save man-hours.

Inactive Publication Date: 2016-06-22
SHENXUN COMP KUNSHAN
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] Therefore, the purpose of the present invention is to provide a kind of testing U disk, solve when testing the USB2.0 and USB3.0 function of computer machine, need to insert USB2.0 U disk and USB3. Troublesome and time-consuming testing process

Method used

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  • USB (Universal Serial Bus) disk used for test

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Embodiment Construction

[0014] see figure 1 , figure 1 It is a structural schematic diagram of a preferred embodiment of the U disk for testing of the present invention.

[0015] In order to achieve the above object, the testing U disk provided by the present invention includes:

[0016] An internal circuit 100, which leads to two USB2.0 signal pins 101-102 and four USB3.0 signal pins 103-106;

[0017] One side of the USB interface 200 is connected to the outside world, and the other side has two USB2.0 signal pins 201-202, four USB3.0 signal pins 203-206, the USB interface 200 and the internal circuit 100 are also connected through the power pin;

[0018] The slider 300 has four contacts 301 at its two ends, and the four contacts 301 at one end of the slider 300 are connected to the four contacts 301 at the other end in a one-to-one correspondence ( figure 1 In order to avoid confusion caused by too many lines in the drawing), when the slider 300 slides in the first direction, the four contacts ...

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Abstract

The invention discloses a USB (Universal Serial Bus) disk used for test. The USB disk comprises an internal circuit, a USB interface and a sliding block, wherein the internal circuit leads two USB2.0 signal pins and four USB3.0 signal pins; one side of the USB interface is connected with outside, the other side of the USB interface is provided with two USB2.0 signal pins and four USB3.0 signal pins; two ends of the sliding block are independently provided with four contacts; and the sliding block slides to a first direction, four contacts on two ends of the sliding block are independently connected with the four USB3.0 signal pins of the internal circuit and the the four USB3.0 signal pins of the USB interface one by one, the sliding block slides to a direction opposite to the first direction, and two of the four contacts on two ends of the sliding block are independently connected with the two USB2.0 signal pins of the internal circuit and the two USB2.0 signal pins of the USB interface one by one. Plugging damage and operation trouble caused by that two types of USB disks are adopted to carry out multiple-time plugging can be avoided.

Description

【Technical field】 [0001] The invention relates to a U disk, in particular to a U disk for testing. 【Background technique】 [0002] For electronic products such as notebook computers, there are usually several USB (UniversalSerialBus, universal serial bus) interfaces on it. The current USB interfaces on electronic products are usually USB3.0 interfaces. Before the electronic products leave the factory, tests will be carried out to ensure that the functions of each interface are qualified. For the USB3.0 interface, in order to be backward compatible, it is necessary not only to test whether it can work normally when connected to USB3.0 devices, but also to test whether the devices connected to USB2.0 can work normally. USB2.0 devices will use a set of send (transport) and receive (receive) pins, while USB3.0 devices will use two sets of send and receive pins. [0003] The current test method is to use USB2.0 equipment (such as U disk), USB3.0 equipment (such as U disk) to ca...

Claims

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Application Information

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IPC IPC(8): G06F11/26G11C7/10
Inventor 贺文辉
Owner SHENXUN COMP KUNSHAN