Contact net pantograph stagger value overrun defect recognition method and system
A technology for pulling overruns and defect identification, applied in the catenary field, to achieve the effect of reducing false alarms, reducing false alarms, and improving identification accuracy
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[0054] The technical solutions of the present invention are further described in detail below with reference to the accompanying drawings, but the protection scope of the present invention is not limited to the following.
[0055] Due to the relatively complex advantages of the external environment, the pull-out value is sometimes miscalculated, and the pull-out value cannot be judged only by the pull-out value. Therefore, the present invention introduces limited conditions such as peak-valley difference threshold, extreme value, number of contact lines, etc., to limit the pull-out over-limit judgment, and reduce the problem of false alarms of pull-out value over-limit defects.
[0056] (1) Defect identification method for over-limit defect of catenary pantograph pull-out value
[0057] like figure 1 As shown, this embodiment describes a method for identifying a defect of a catenary pantograph pull-out value exceeding the limit, and the method includes at least the following ...
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