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Multi-layer PCB dielectric layer thickness detection apparatus and detection method based on capacitance measurement

A PCB board, thickness detection technology, applied in electromagnetic measuring devices, electrical/magnetic thickness measurement, etc., can solve the problems of scrapped PCB units, scrapped PCB boards, damaged PCB units, etc., to avoid complexity and destructive effects.

Inactive Publication Date: 2016-08-03
鹤山市中富兴业电路有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, this method will inevitably damage the PCB unit and cause the PCB unit to be scrapped, or even the entire PCB board to be scrapped.

Method used

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  • Multi-layer PCB dielectric layer thickness detection apparatus and detection method based on capacitance measurement
  • Multi-layer PCB dielectric layer thickness detection apparatus and detection method based on capacitance measurement

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Embodiment Construction

[0016] The present invention will be further described below in conjunction with accompanying drawing and example.

[0017] refer to figure 1 , figure 2 , a kind of multi-layer PCB dielectric layer thickness detection device based on capacitance test of the present invention, comprises several copper blocks (2 , 3, 4, 5), and several test pads (6, 7, 8, 9) arranged on the first layer of the multilayer PCB board 1, the several test pads (6, 7, 8, 9) respectively correspond to the copper blocks (2, 3, 4, 5) of each layer of the multi-layer PCB board 1; the copper blocks (2, 3, 4, 5) of each layer are connected through lead wires and / or metallization The guide holes (10, 11, 12) are connected with the corresponding test pads (6, 7, 8, 9).

[0018] Such as figure 2 The shown PCB board 1 has four layers, and the first layer of copper blocks 2 is connected to the corresponding first layer of test pads 6 through leads; The leads of the same layer are connected to the metallize...

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Abstract

The invention discloses a detection device and a detection method for the thickness of the dielectric layer of a multilayer PCB board based on capacitance testing. copper blocks, and several test pads arranged on the first layer of the multi-layer PCB board, the several test pads are respectively corresponding to the copper blocks of each layer of the multi-layer PCB board; each layer of copper The blocks are connected to corresponding test pads by wires and / or plated vias. The method is to use a capacitance tester to measure the capacitance value between the copper blocks of each layer, and can quickly, simply, intuitively and accurately judge whether the thickness of the dielectric layer between the layers of the PCB board meets the requirements by comparing the designed theoretical capacitance value, so as to avoid complexity and destructiveness of slice analysis.

Description

technical field [0001] The invention relates to a detection device and a detection method for the thickness of a multilayer PCB board medium layer based on capacitance testing. Background technique [0002] With the development of the PCB industry and entering the information age, the signal transmission frequency is not only high, but also the speed is very fast, and the performance requirements of the PCB, especially the requirements for the impedance board, are becoming more and more stringent. The factors affecting the impedance of PCB traces mainly include the width of copper wire, the thickness of copper wire, the dielectric constant of the medium, the thickness of the medium, the thickness of the pad, the path of the ground wire, the traces around the trace, etc., and The thickness of the dielectric layer between PCB layers is often strictly controlled during the PCB manufacturing process. At present, the method of judging the thickness of the dielectric layer betwee...

Claims

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Application Information

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IPC IPC(8): G01B7/06
CPCG01B7/08
Inventor 崔蜀巍
Owner 鹤山市中富兴业电路有限公司
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