Resonator apparatus and measurement method for measuring surface intrinsic impedance of high-temperature superconductive film

Abstract

The invention discloses a resonator apparatus and measurement method for measuring surface intrinsic impedance of a high-temperature superconductive film. The apparatus is divided into a cavity portion and a height adjusting portion. The cavity portion comprises a base plate, a copper cavity, a spring, a lower sample table, a medium column, an upper sample table, a coupling cable, a self-parallel ball and a phosphor copper pressure sheet, wherein the upper sample table can move up and down through the height adjusting portion. The height adjusting portion comprises a metal fixation plate, a metal rod, a metal pipe, piezoelectric ceramics and a spring, wherein the piezoelectric ceramics realizes height adjustment. The cavity portion and the height adjusting portion are connected through polyethylene rods and a polyethylene block. Measurement employs a TE012 mode and a TE021 mode, and the intrinsic surface impedance of the superconductive film is obtained through measurement of the resonant frequency and the quality factor of a medium resonant cavity. The apparatus provided by the invention is applied to high-temperature superconductive films with any thicknesses, can measure effective surface impedance of the high-temperature superconductive films and can also measure intrinsic impedance of the high-temperature superconductive films.

Description

technical field [0001] The invention relates to superconductivity measurement, in particular to a resonator device and a measurement method for measuring the surface intrinsic impedance of a high-temperature superconducting thin film. Background technique [0002] In general, the surface impedance of a superconducting film is defined as the tangential component of the electric field on the surface of the film E t with the magnetic field tangential component H t Ratio: Z S =E t / H t =R S +jX S , where R S Indicates the surface resistance, X S represents the surface reactance. Surface impedance is a very important parameter of superconducting thin films. It not only reflects the loss performance of superconducting thin films, but also characterizes the depth of magnetic penetration. It is often used to compare the advantages and disadvantages of superconducting thin films. [0003] High-temperature superconducting films are generally grown on the substrate. The surfac...

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Problems solved by technology

This method uses two dielectric columns, which introduces the error caused by the difference between the dielectric columns. At the same time, it is required that the penetration depth of the superconducting film is at least three times greater, otherwise, the effective surface resistance is measured at this time. Moreover, the method Can only measure surface resistance, not surface reactance

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