Display panel, display panel test system and test method for display panel

Abstract

The invention discloses a display panel, a display panel test system and a test method of a display panel. The display panel comprises an in-plane thin film transistor, a pixel electrode layer, first metal layer test terminals, second metal layer test terminals and pixel electrode layer test terminals, wherein the in-plane thin film transistor comprises a first metal layer and a second metal layer, a first pathway end of a test thin film transistor is electrically connected with a first end portion of the first metal layer, a second pathway end is connected electrically with a first end portion of the pixel electrode layer, a control end is electrically connected with a first portion of the second metal layer, the first metal layer test terminals are electrically connected with a second end portion of the first metal layer, the second metal layer test terminals are electrically connected with a second end portion of the second metal layer, the pixel electrode layer test terminals are connected electrically with a second end portion of the pixel electrode layer, and the first metal layer test terminals, the second metal layer test terminals and the pixel electrode layer test terminals are used for connection with test equipment. According to the invention, real impedance of the in-plane thin film transistor of the display panel can be tested and estimated.

Description

technical field [0001] The present invention relates to the technical field of display panel testing, in particular to a display panel, a display panel testing system and a display panel testing method. Background technique [0002] TEG electrical test is a test to be carried out before the display panel leaves the factory. In order to perform TEG electrical test, the circuit layout design of the existing display panel products is the test point designed outside the test surface when testing the volt-ampere characteristic curve of the pixel structure. , judge whether the volt-ampere characteristic curve meets the process requirements through the test results of the test points. Because the test point design is only a simulation test, it is difficult to obtain the real impedance of the thin film transistor, which makes it impossible to truly reflect the volt-ampere characteristic curve of the pixel structure in the effective display area of ​​the display panel, and there is R...

AI Technical Summary

Problems solved by technology

Because the design of the test point is only a simulation test, it is difficult to obtain the real impedance of the thin film transistor, which makes it impossible to truly reflect the volt-ampere characteristic curve of the pixel structure in the effective display area of ​​the display panel, and there is an RC delay in the real in-plane volt-ampere characteristic curve test

Existing RC delay effects are only simulated by design software

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