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A light emission testing device with a shutter

A technology for testing devices and switches, which can be used in measuring devices, optical radiation measurement, photometry, etc., and can solve problems such as inaccurate determination of optical characteristics

Inactive Publication Date: 2016-11-09
ISMECA SEMICONDUCTOR HOLDING SA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] A disadvantage associated with each of the existing solutions is that, during testing, the mount / platform on which the LEDs are supported deflects the light emitted by the LEDs; the deflected light can lead to uncertainties in the light characteristics of the LEDs. precise

Method used

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  • A light emission testing device with a shutter
  • A light emission testing device with a shutter
  • A light emission testing device with a shutter

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Embodiment Construction

[0065] figure 1 A perspective view of an assembly 100 according to an embodiment of an aspect of the present invention is provided; the assembly 100 includes a test device 1 according to an embodiment of another aspect of the present invention in the form of an integrating sphere 1 for measuring the light characteristics of an LED 3 form. The test device 1 includes a package 1a.

[0066] will now refer to Figure 2-8a , 8b describes in more detail an exemplary embodiment of a testing device 1 in the form of a light integrating sphere 1 when used for testing electronic components in the form of LEDs. It should be understood, however, that the present invention is not limited to integrating spheres for testing LEDs; the present invention may be used with any test setup for testing any type of electronic component and having packages that need to be selectively opened and closed .

[0067] figure 2 with image 3 provided separately in figure 1 A cross-sectional view of th...

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PUM

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Abstract

An testing device (1) for measuring the light characteristics of an electronic component (3), the testing device (1) comprising, an inlet (5) at one end at which an electronic component (3) can be presented for testing; a shutter (7) located at the inlet, wherein the shutter (7) is configured to be moveable between a first open position in which an electronic component (3) to be tested can be received into the inlet (5), and a second closed position in which the shutter (7) can overlay at least the majority of a nest (9) on which said electronic component (3) is supported, so that the shutter can prevent light emitted by the electronic component (3) from being diverted away from the testing device (1) by at least the majority of the nest (9) wherein the shutter (7) comprises at least one sliding door (15a, 15b9 which can be slid to move the shutter into its first open position, and slid to move the shutter (7) into its second closed position, and wherein the at least one sliding door (15a,15b) comprises a cut out portion (17) which defines said opening (11) when the shutter (7) is in its second closed position. There is further provided an assembly which include the testing device (1).

Description

technical field [0001] The present invention relates to a test device, and in particular to a light emission test device, such as a light integrating sphere, for testing the light characteristics of electronic components, such as LEDs. In particular, the present invention relates to a test device comprising a shutter capable of opening to allow light emitting parts of an electronic component (eg LED) to be received within the test device (eg light integrating sphere) for testing , and can be turned off prior to testing to prevent light emitted by the electronic component from being scattered by a nest on which the electronic component is supported. Background technique [0002] Light integrating spheres are usually used to test the light characteristics of LEDs. Typically, the LED is supported on a seat on a turntable; the turntable is rotated so that the LED is directly below the entrance of the light integrating sphere; when in this position, power is supplied to the LED ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J1/02G01J1/42G01J1/04
CPCG01J1/0214G01J1/0223G01J1/0271G01J1/0474G01J1/42G01J2001/0481G01J2001/4252G01J1/044
Inventor S.维翼诺特
Owner ISMECA SEMICONDUCTOR HOLDING SA