Large-change density electronic speckle interference fringe graph direction and density processing method

A technology of electronic speckle interference and processing method, which is applied in the field of optical detection and optical information processing, and can solve the problems of difficult parameter selection and impossible realization.

Inactive Publication Date: 2017-01-04
TIANJIN UNIV
View PDF4 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This makes parameter selection for these methods difficult, if not impossible

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Large-change density electronic speckle interference fringe graph direction and density processing method
  • Large-change density electronic speckle interference fringe graph direction and density processing method
  • Large-change density electronic speckle interference fringe graph direction and density processing method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0032] The calculation of the direction and density of ESPI fringe pattern with large variation density is far more difficult than that of general density fringe pattern, even more difficult than the calculation of direction and density of high-density ESPI fringe pattern, which is a challenging problem. The present invention provides a method for calculating the direction and density of a large-variation density electronic speckle interference fringe pattern based on variational image decomposition. A large-variation ESPI fringe pattern is decomposed into two ESPI fringe patterns with uniform density through variational image decomposition technology. The fringe directions and densities of the two ESPI fringe images are calculated separately by the existing simple method, so as to obtain the direction and density values ​​suitable for the whole image.

[0033] The technical scheme adopted in the present invention is a method for processing the direction and density of the larg...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention belongs to the optical detection and optical information processing technology field and aims to acquire the direction and a density value of a large-change density electronic speckle interference fringe pattern. The method comprises steps that step 1, a large-change electronic speckle interference measurement ESPI fringe pattern f is inputted; step 2, a variation image decomposition BL-Hilbert model is utilized to divide the large-change ESPI fringe pattern f into two ESPI fringe patterns with uniformly-distributed densities; step 3, fringe directions and densities of a low-density ESPI fringe pattern u and a high-density ESPI fringe pattern v are respectively calculated; and step 4, the fringe direction and the density of the integral pattern can be acquired through comprehensively selecting the fringe directions and the densities of the low-density ESPI fringe pattern u and the high-density ESPI fringe pattern v. The method is mainly applicable to optical detection and optical information processing occasions.

Description

technical field [0001] The invention belongs to the technical field of optical detection and optical information processing, and relates to the research and application of a direction and density calculation method of a large-variation-density electronic speckle interference fringe pattern based on variational image decomposition. Background technique [0002] Electrostatic speckled pattern interferometry (ESPI for short) is a non-destructive full-field optical measurement technology, which is widely used in the field of optical rough surface displacement, deformation measurement, non-destructive testing and vibration analysis (see literature [1 ]). The fringe direction and density are important information of the electron speckle interference image. Obtaining accurate orientation maps and density maps is an important step in the preprocessing of electronic speckle interference images, and is an important basis for subsequent processing such as speckle image filtering, enha...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01B9/02
CPCG01B9/02083G01B9/02094G01B9/02095
Inventor 唐晨陈霞李碧原苏永钢
Owner TIANJIN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap