Circuit probing system and its circuit probing device

A technology of circuit detection and probe, which is applied in the direction of measuring device, electronic circuit test, measuring device shell, etc., can solve the problem of damaging the probe card probe, affecting the electrical performance and test results of the probe card, and accidentally touching the probe card probe. Needle and other issues

Inactive Publication Date: 2017-02-22
GLOBAL UNICHIP CORPORATION +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, when the operator picks and places the probe card, it often leads to accidentally touching the probes on the surface of the probe card, and then damages the probes on the surface of the probe card, which affects the electrical performance and test results of the probe card.

Method used

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  • Circuit probing system and its circuit probing device
  • Circuit probing system and its circuit probing device
  • Circuit probing system and its circuit probing device

Examples

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no. 1 approach

[0033] figure 1 An exploded view of the probe card 100 and the protective cover 200 of the circuit detection device 10 according to the first embodiment of the present invention is shown. figure 2 draw figure 1 The top view of the probe card 100. Such as figure 1 and figure 2 As shown, the circuit detection device 10 includes a probe card 100 and a protective cover 200 . The probe card 100 includes a substrate body 110 , a probe area 130 and a plurality of first magnetic attractors 140 . The substrate body 110 has a front side 111 and a back side 112 opposite to each other. The probe area 130 is disposed on the front surface 111 of the substrate body 110 . A plurality of openings 120 are also formed on the front surface 111 of the substrate body 110 . Each first magnetic element 140 is fixed in one of the openings 120 and connected to the substrate body 110 . The protective cover 200 is removably fixed on the probe card 100 . The protection cover 200 includes a cove...

no. 2 approach

[0044] The circuit detection device of the second embodiment is substantially the same as the circuit detection device of the first embodiment, except that the second magnetic attraction part 220 of the first embodiment is composed of permanent magnets as a whole ( figure 1 ), on the other hand, Figure 4 A schematic diagram of the second magnetic member 230 of the protective cover 201 according to the second embodiment of the present invention is shown. Such as Figure 4 As shown, the second magnetic element 230 includes a columnar body 231 and a magnetic block 232 . The columnar body 231 is located between the magnetic block 232 and the cover 210 so as to attract each other with the first magnetic member.

[0045] so, compared to figure 1 The second magnetic piece 220 is a permanent magnet as a whole. In the second embodiment, a smaller magnetic block 232 is arranged at the end of the columnar body 231 to attract each other with the first magnetic piece. Not only can it b...

no. 3 approach

[0047] Figure 5A to Figure 5B A schematic diagram of the operation of the circuit detection system 1 according to the third embodiment of the present invention is shown. Such as Figure 5A to Figure 5B As shown, in this embodiment, the circuit detection system 1 includes the above-mentioned circuit detection device 10 , a pick-up device 300 and a transmission device 400 . The circuit detection device 10 of the third embodiment adopts all the features of the circuit detection devices of the above-mentioned embodiments. The pick-up device 300 is used to disengage the protective cover 200 from the probe card 100 in a straight line in a second direction (such as Z-axis downward) by moving the holding portion 240 . The transmission device 400 is electrically connected to the fetching device 300 to drive the fetching device 300 to move. The transmission device 400 is, for example, a known technology such as a motor or a cylinder. However, the present invention is not limited the...

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PUM

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Abstract

A circuit probing system and a circuit probing device thereof are provided. The circuit probing device includes a probe card and a protective lid. The probe card is provided with a probe area, a bore hole and a first magnetic attraction member disposed in the bore hole. The protective lid is provided with a second magnetic attraction member. When the protective lid covers the probe area, and the second magnetic attraction member inserts into the bore hole, the protective lid is fixed on the probe card as the first magnetic attraction member and the second magnetic attraction member magnetically attract with each other. Therefore, the possibility of the damage to the probe area of the probe card can be reduced, and the electrical performance and the test result of the probe card are not affected.

Description

technical field [0001] The present invention relates to a circuit detection device and system, in particular to a circuit detection device and system capable of covering its probe area. Background technique [0002] The manufacturing process of traditional semiconductor and optoelectronic products (such as light-emitting diodes, liquid crystal displays, and plasma display panels) includes a quality testing procedure. This quality test procedure is to electrically contact the metal pad of the test circuit with the probe of the probe card, so as to measure the connection reliability and continuity of the test circuit, so as to quickly interpret or correct the parameters that cause circuit defects, and then Improve process yield (yield). [0003] However, when the operator picks and places the probe card, it often causes the probes on the surface of the probe card to be touched by mistake, and then the probes on the surface of the probe card are damaged, thereby affecting the ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R1/04G01R1/073
CPCG01R1/07307G01R1/16G01R31/2808G01R31/2867
Inventor 廖致傑孙育民程志丰
Owner GLOBAL UNICHIP CORPORATION
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