Unit-type dual-band infrared detection assembly suitable for low-temperature environment

Abstract

The invention relates to a unit-type dual-band infrared detection assembly suitable for a low-temperature environment. The unit-type dual-band infrared detection assembly mainly serves as a photovoltaic conversion sensor at the front end of a signal chain, and is especially suitable for the analysis and application field of broadband infrared spectrum under the low-temperature environment, wherein the low-temperature environment is an environment, where the temperature is lower than 80 K, preferably, 60 K-80 K; and the broadband, in the example, is 2.5-13.3 [mu]m infrared wavelength. A Dewar cavity is utilized to enable a color separation film to be packaged with two types of unit-type detectors, thereby effectively solving the problem of broadband coverage hard to be realized by single type of detector Dewar package; the detection assembly can combine a refrigerating machine to realize work under the low-temperature environment; and a pre-amplification circuit is integrated in the assembly in the form of a chip module, so that system noise can be further suppressed, and a voltage signal can be output directly.

Description

technical field [0001] The invention relates to a unit-type dual-band infrared detection component suitable for low-temperature environments, which is mainly used as a photoelectric conversion sensor at the front end of a signal chain, and is especially suitable for wide-band infrared spectrum analysis and application fields in low-temperature environments. The low-temperature environment refers to a temperature lower than 80K, preferably 60K-80K; the wide-wave band is the infrared light wavelength ranging from 2.5 μm to 13.3 μm. Background technique [0002] Infrared detectors are more and more widely used in the field of infrared spectrum analysis. It is the source of obtaining infrared incident light information. It converts the input light into electrical signals for subsequent processing, and then obtains characteristic spectra such as signal amplitude, phase, and spectrum. valid information. At present, with the development of spectral detection technology, the requir...

AI Technical Summary

Problems solved by technology

At present, with the development of spectral detection technology, the requirements for low-noise characteristics and wide spectral coverage of detectors are getting higher and higher, and the existing detector technology is difficult to meet the current needs

[0003] Most of the existing detectors are packaged in the form of units or arrays, and their spectral coverage depends on the spectral response range of the detector pixel itself. The spectral response range of the same type of detector is very limited due to the influence of the pixel material, and it cannot achieve wide The coverage of the band range; on the other hand, the traditional detector is affected by the separation and connection of the preamplifier circuit and the Dewar or the detector by an external cable, and it is easy to introduce more circuit noise, thereby reducing the detection resolution

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