A method for detecting abnormal points in heat meter durability cold and heat shock test
A technology of durability test and thermal shock, applied in the field of instrument anomaly detection, it can solve the problems of long durability test process, economic loss, and large flow cycle change span.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
test approach 3
[0125] Among them: f(μ, σ, max, min, Med, Desc, Asc) is the abnormal point detection function, 1 means normal, 0 means abnormal, E 3 For test method 3, that is, the set of all characteristic parameters under 4000 thermal shock tests, X 3 is the current feature parameter set under test method 3;
[0126] E3=(O GYmax ∩O GYmin )∩(O SWmax ∩O SWmin )∩(O CLSmax ∩O CLSmin ∩O LELS1 ∩O LELS2 )
[0127] ∩(O LJ )∩((O GLGWG ∩O GLGWD ∩O GLGWC )∪(O GLDWG ∩O GLDWD ∩O GLDWC ))
[0128]If the detection data result is abnormal, all the eigenvalues of the abnormal points are obtained, and all the eigenvalues of the abnormal points are added to the abnormal data set. The abnormal data set records the process state parameters using different feature extraction methods under different working conditions. The collection of detected outliers, according to whether the outliers appear continuously in the continuous sampling period, the outliers can be divided into two cases: the ou...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com