Shape and color integration insulator identification and defect detection method

Abstract

The invention relates to a shape and color integration insulator identification and defect detection method. According to the method, a potential insulator region on an unmanned plane inspection image is identified according to insulator sheet arrangement characteristics, an error identification region is further detected according to insulator color significant characteristics, an incomplete-identification insulator region can be compensated according to main color components of an insulator prior knowledge model, and lastly, an insulator chip shell defect is diagnosed according to an insulator sheet position relationship. Through integrating shape and color characteristics of an insulator, the insulator region can be accurately and completely identified from a complex background, the insulator chip shell defect is detected through analyzing the insulator sheet position relationship, and the method can be effectively applied to unmanned plane high voltage transmission line inspection business.

Description

technical field [0001] The invention relates to an insulator recognition and defect detection method based on fusion of shape and color. In particular, it involves extracting line segments in various directions on UAV images, clustering line segments according to the arrangement characteristics of insulator sheets, identifying potential insulator areas, detecting misrecognition areas and compensating for incomplete identification areas through insulator color salience features, and through The positional relationship between adjacent insulator sheets in the image is analyzed to detect insulator drop defects. Background technique [0002] Insulators are one of the most common components in overhead high-voltage transmission lines, and insulators play a very important role in the normal operation of overhead high-voltage lines. Since the insulator is exposed to the field for a long time, it will be eroded by the field environment to a certain extent. Usually, the defects of t...

AI Technical Summary

Problems solved by technology

This method only considers the scene of the chip falling off inside the insulator, but does not consider the chip falling off at both ends of the insulator, and cannot completely detect the chip off defect of the insulator

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