A capacitor withstand voltage and overvoltage periodic test combined test system

Abstract

A capacitor withstand voltage and overvoltage periodic test combined test system is provided with a voltage regulator and an exciting transformer. A wave modulation device is arranged between the voltage regulator and the exciting transformer. An adjustable reactor and a shifted gear compensation reactor are arranged beside the exciting transformer. The voltage regulator and exciting transformer perform regulation by means of a control and test system. In the test system, the wave regulation device is arranged; through the wave regulation device speed switching, a purpose of voltage periodic tests can be realized; boost relies on working of the exciting transformer to meet requirements of the test system for high voltages, and the entire test system can be covered; the inductance of the reactor is adjusted by adjusting an inductive tap and an inductive air gap to achieve the purpose of tuning; in the voltage periodic tests, the wave regulation device is provided with a thyristor switch and a resistance wire so as to preventing overcharging of the test system and satisfy requirements by national standards.

Description

technical field [0001] The invention relates to a test system, in particular to a comprehensive test system for capacitor withstand voltage and overvoltage cycle tests. Background technique [0002] According to the provisions of GB / TI 1024.2-2001, the waveform of the power capacitor overvoltage cycle test must meet the figure 1 The requirements shown. figure 1 What is actually given in is the magnitude of the voltage and the corresponding duration. Among them, Un is the rated working voltage of the capacitor under test, and T0=20 ms is the cycle time of the power frequency voltage. The standard stipulates that the magnitude of the overvoltage and the establishment time (≤20 T0), duration (≤(21±2) T0) and removal time (≤20 T0) of the overvoltage must be strictly guaranteed. [0003] At present, very few companies at home and abroad have developed this set of equipment, such as figure 2 Shown is a double-circuit test system, which is equipped with two voltage regulators ...

AI Technical Summary

Problems solved by technology

[0003] At present, very few companies at home and abroad have developed this set of equipment, such as figure 2 Shown is a double-circuit test system, which is equipped with two voltage regulators and two isolation transformers at the same time. High, difficult to adjust the wave, it is difficult to meet the standard requirements, and the start-up capital of the project is too high, and the power energy is wasted during use. In view of this, we have developed a single-circuit test device

Images