A device and method for quickly testing solar cell potential-induced decay
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- TRINA SOLAR CO LTD
- Publication Date
- 2018-05-15
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Abstract
Description
technical field
[0001] The invention relates to a testing device for potential-induced attenuation of a solar cell, in particular to a device and method for quickly testing the potential-induced attenuation of a solar cell, belonging to the technical field of solar cell testing. Background technique
[0002] Potential Induced Degradation (PID, potential Induced Degradation) is one of the characteristics of photovoltaic cells. It refers to the phenomenon that the output of solar cells will drop when high voltage flows through the solar cells in a high-temperature and humid environment.
[0003] Currently, potential-induced degradation is rapidly becoming one of the serious degradations in the field of photovoltaics. Modules are prone to serious power attenuation due to sodium ion migration or surface polarization in a high-temperature and high-humidity environment. The existing methods for testing the potential induced decay of solar cells mainly adopt the international IEC ...