Aging test device and negative pressure cooling system for the aging test device
A technology for aging testing and cooling systems, applied in measuring devices, environmental/reliability testing, components of electrical measuring instruments, etc., can solve problems such as increased testing costs, difficulty in heat dissipation, and inability to effectively eliminate heat accumulation
Active Publication Date: 2019-04-09
KING YUAN ELECTRONICS
View PDF12 Cites 0 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
[0004] However, although such a cooling and heat dissipation system can carry out heat dissipation and cooling to the open aging test device (or aging test furnace), since the air that is closer to the air inlet port 4 is the air that has just entered from the external environment, the air here The lower the temperature, the closer the temperature to the air inlet port 4 in the aging test furnace is, the lower the temperature is, and the closer to the air outlet port 5 is the air that has been heated by the aging test seat 2 on the aging test board 1, so Relative to the air temperature at the air inlet port 4, the temperature of the air here (i.e. the air outlet port 5) is higher, resulting in the higher the temperature in the aging test furnace closer to the air outlet port 5
Such temperature differences lead to uneven temperature in the aging test furnace, and thus lead to turbulent flow in the aging test furnace, making it difficult for the hot air in the aging test furnace to be discharged and dissipated.
Secondly, because the flow direction of the air of the external environment in the aging test furnace and the flow direction of the hot air discharged by the fan 3 on the aging test seat 2 are perpendicular to each other, the air flow in the aging test furnace will also be caused by two different flow directions. The turbulent flow caused by the collision increases the difficulty of hot air discharge and heat dissipation in the aging test furnace
Such situation will make the components in the burn-in test device (such as burn-in test control components, burn-in test boards, burn-in test sockets, etc.) after a long time of use, it is easy to be damaged because the accumulated heat cannot be effectively eliminated, and need to be replaced
In this way, it will not only reduce the test efficiency, but also increase the test cost due to frequent replacement of parts
In addition, since the air near the air inlet port 4 is in continuous contact with lower temperature air, the area (or the electronic component to be tested) closer to the air inlet port 4 is less likely to be heated, and the aging test seat 2 needs to be enlarged. The power of the internal heater is required to reach the preset test temperature, resulting in an increase in test costs
Because the air near the air outlet port 5 is continuously in contact with higher temperature air, the closer to the air outlet port 5 (or the electronic component to be tested) is easy to store heat and overheat, which is easy to cause damage to the parts or the electronic component to be tested. This increases the risk of damage to electronic components under test due to burn-in tests
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreImage
Smart Image Click on the blue labels to locate them in the text.
Smart ImageViewing Examples
Examples
Experimental program
Comparison scheme
Effect test
Embodiment Construction
[0042] Some embodiments of the invention are described in detail below. However, the invention can be broadly practiced in other embodiments than this detailed description. That is to say, the scope of the present invention is not limited by the proposed embodiments, but is subject to the protection scope of the patent claims of the present invention. Secondly, when each element or step in the illustrations of the embodiments of the present invention is described as a single element or step, it should not be regarded as a limited cognition, that is, when the following description does not particularly emphasize the limitation on the number of the present invention The spirit and scope of application of the invention can be extended to structures and methods in which multiple elements or structures coexist. Furthermore, in this specification, different parts of each element are not drawn in full scale, and some dimensions are exaggerated or simplified compared with other relev...
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More PUM
Login to View More Abstract
The invention relates to an aging test device and a negative pressure cooling system for the aging test device, which particularly relates to a negative pressure cooling system for an open-type aging test device and the open-type aging test device using the negative pressure cooling system. The negative pressure cooling system comprises a transverse exhaust passage, an air collection area and a main exhaust passage. With the help of the transverse exhaust passage, the air collection area and the main exhaust passage, a negative pressure passage is formed to enabling air around the aging test device and hot air inside the aging test device to be exchanged continuously, and accumulated heat in an aging test furnace can be effectively removed.
Description
technical field [0001] Negative pressure cooling system for aging test device and aging test device using the negative pressure cooling system, especially a negative pressure cooling system for open aging test device and open aging test using the negative pressure cooling system device. Background technique [0002] In the manufacturing process of electronic components (such as IC components), after the electronic components are manufactured, an aging test is usually performed on the electronic components to test the reliability of the electronic components. The burn-in test is to place the electronic components in the burn-in test machine for heating, and at the same time conduct an electrical test on the electronic components to test whether the reliability of the electronic components meets the standards. The aging test device can be divided into two types according to the structure of the aging test furnace inside: the closed aging test device and the open aging test de...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More Application Information
Patent Timeline
Login to View More Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00G01R1/02
CPCG01R1/02G01R31/003
Inventor 刘大纲林宗毅
Owner KING YUAN ELECTRONICS