Image defect detection method

A defect detection and image technology, applied in image enhancement, image analysis, image data processing, etc., to achieve the effect of accurate defect detection and cost reduction

Active Publication Date: 2017-06-09
INST OF AUTOMATION CHINESE ACAD OF SCI +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] In order to solve the above-mentioned problems in the prior art, that is, in order to solve the problem of how to realize accurate detection of defects in images while reducing costs, the present invention provides a method for detecting defects in images, and the method includes the following steps:

Method used

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Embodiment Construction

[0062] Preferred embodiments of the present invention are described below with reference to the accompanying drawings. Those skilled in the art should understand that these embodiments are only used to explain the technical principles of the present invention, and are not intended to limit the protection scope of the present invention.

[0063] The present invention proposes an image defect detection method. The specific implementation of the present invention will be described in detail below with reference to the accompanying drawings.

[0064] Such as figure 1 As shown, the method specifically includes the following steps:

[0065]Step 101, scan the image to be detected, and acquire the edge profile of the pattern to be detected in the image to be detected.

[0066] In this step, when performing edge contour extraction, it is necessary to perform image enhancement and canny processing on the image to be detected.

[0067] Before selecting the search point in the edge pro...

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Abstract

The invention relates to an image defect detection method. The image defect detection method comprises steps that a to-be-detected image is scanned, and an edge contour of a to-be-detected pattern in the to-be-detected image is acquired; searching points in the edge contour are selected, and are projected in a template image, which is the same as the to-be-detected pattern, and defect points are acquired to form a defect point cluster; defect size information corresponding to every defect point in the defect point cluster is calculated. Under a cost reduction condition, the accurate detection of the image defect is realized.

Description

technical field [0001] The invention belongs to the field of image pattern recognition, in particular to an image defect detection method. Background technique [0002] Nowadays, smart phones have been widely used, and mobile phone covers are important components of smart phone devices. In the process of mobile phone cover inspection, most of the inspections currently rely on manual naked eye recognition. Relying on the method of manual naked eye recognition is not only time-consuming and affects people's vision, but also causes missed or over-inspection due to different detection indicators for different people. [0003] At present, the Logo area defect detection equipment on the market is not yet mature, and some Logo defect detection equipment can only detect larger defects in the Logo area. The size and location of defects cannot be accurately calculated. Another kind of Logo area detection equipment takes a long time to process the algorithm and is extremely expensiv...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06T7/13G06T7/136G06K9/62
CPCG06T7/0008G06T2207/10004G06F18/23213
Inventor 宫新一徐德张正涛沈飞苏虎杨化彬袁智超
Owner INST OF AUTOMATION CHINESE ACAD OF SCI
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