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Method and device for adjusting magnetoacoustic array structure of metal plate defect contour guided wave imaging

A technology of array structure and metal plate, which is applied in the analysis of solids using sonic/ultrasonic/infrasonic waves, processing the response signal of detection, etc., to achieve the effect of improving imaging accuracy, accurate calculation, and solving serious mismatches

Active Publication Date: 2019-07-26
TSINGHUA UNIV
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

[0008] For this reason, the first purpose of the present invention is to propose a method for adjusting the structure of the magnetoacoustic array for guided wave imaging of metal plate defect contours. It is more targeted, and can perform high-precision contour imaging on the actual complex defects of the metal plate, which is convenient to operate and improves the imaging efficiency of the actual complex defect contours

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  • Method and device for adjusting magnetoacoustic array structure of metal plate defect contour guided wave imaging
  • Method and device for adjusting magnetoacoustic array structure of metal plate defect contour guided wave imaging
  • Method and device for adjusting magnetoacoustic array structure of metal plate defect contour guided wave imaging

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Embodiment Construction

[0041] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary and are intended to explain the present invention and should not be construed as limiting the present invention.

[0042] The method and device for adjusting the magnetoacoustic array structure of the metal plate defect contour guided wave imaging according to the embodiments of the present invention will be described below with reference to the accompanying drawings.

[0043] At present, the requirements for the safety of metal plate components are becoming more and more stringent, that is, the development of defect contour shape description, high-precision defect imaging, and visualization of defect detection results.

[0044] In the relate...

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Abstract

A method for adjusting array of omnidirectional EMATs includes: uniformly arranging N EMATs in a detection region of a metal plate; calculating positions of scattering points according to amplitudes and travel times of guided wave scattering signals, and forming a first defect profile curve by performing three smooth spline interpolations on coordinate data of positions of scattering points; calculating curvatures of points on the first defect profile curve by solving a first and second derivatives of a function of the first defect profile curve; determining an array adjustment region by comparing the curvature with a preset threshold, adjusting the array and calculating a second defect profile curve; and performing data fusion on the first and second defect profile curves to form a defect profile image of the metal plate.

Description

technical field [0001] The invention relates to the technical field of non-destructive testing, in particular to a method and device for adjusting the structure of a magnetoacoustic array for defect contour guided wave imaging of a metal plate. Background technique [0002] Usually, in metal plate component inspection engineering, most of them can only judge the presence or absence of defects and determine their positions. In addition, quantitative information such as the size and contour shape of metal plate component defects can be obtained as an important basis for evaluating the health of the metal plate structure and guiding its repair and maintenance work. [0003] With the increasingly stringent requirements for the safety of metal plate components, the detection of metal plate components can no longer be satisfied with the conventional judgment of the presence or absence of defects and the acquisition of equivalent size of defects. The direction of visualization of ...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N29/06G01N29/44
Inventor 黄松岭张宇赵伟王珅王哲
Owner TSINGHUA UNIV