Test method and system for Flash repeated erasing controlled by mobile terminal

Abstract

The invention discloses a test method and system for Flash repeated erasing controlled by a mobile terminal. The method comprises the steps that a system file in the mobile terminal is copied in advance, and the system file is backed up to a predetermined position in a memory of the mobile terminal; the system file is repeatedly copied to the predetermined position for backup, the copied system file and the backed-up system file are compared, and whether a difference exists is judged; when no difference exists through comparison, it is judged that a test of data automatically written into a Flash and erased from the Flash succeeds, the test is performed repeatedly till an upper limit value of the number of tests is reached, and then the test is ended. By repeatedly copying the system file to the predetermined position, comparing the copied system file with the backed-up system file and performing repeated testing, Flash repeated erasing is realized, the situation that Flash damage directly leads to unusability of the mobile terminal is avoided, a large amount of manpower and time investment is saved, and convenience is brought to a user.

Description

technical field [0001] The present invention relates to the technical field of mobile terminals, in particular to a test method and system for controlling Flash repeated erasing and writing by a mobile terminal. Background technique [0002] As mobile terminals are used more and more frequently, people often need to check the Flash ("Flash Memory", flash memory, generally referred to as "Flash" for short) when using mobile terminals. The characteristics are fundamentally different from common memory: all kinds of DDR, SDRAM or RDRAM are volatile memories, and the data in the memory cannot be kept as long as the current supply is stopped, so the data needs to be reloaded into the memory every time the computer is turned on; Flash memory is a kind of non-volatile (Non-Volatile) memory, which can keep data for a long time without current supply. Its storage characteristics are equivalent to hard disks. The basis of the storage medium of the device) frequently writes and erases...

AI Technical Summary

Problems solved by technology

Once the Flash is damaged during this process, it will directly cause the mobile terminal to malfunction, and even cause the mobile terminal to be unusable, resulting in serious consequences; if millions or tens of millions of tests are manually performed on the device side in advance, it will take a lot of time. manpower and time cost

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