A sparc architecture space processor neutron effect test system

A technology of experimental testing and architectural space, which is applied in electrical digital data processing, fault hardware testing methods, environmental/reliability testing, etc. effect of the process

Active Publication Date: 2020-03-27
BEIJING MXTRONICS CORP +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Space processors with SPARC architecture have been widely used in aerospace systems, so it is particularly important to study the ability of space processors with this architecture to resist neutron effects. However, international research on the neutron effect of space processors with SPARC architecture It has just started, and there are almost no relevant literature and patents on neutron effect test test systems and methods

Method used

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  • A sparc architecture space processor neutron effect test system
  • A sparc architecture space processor neutron effect test system
  • A sparc architecture space processor neutron effect test system

Examples

Experimental program
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Embodiment

[0070] After building the space processor neutron effect test system according to the content of the present invention, the power supply module 11 on the monitoring control board 5 converts the 5V voltage input by the external power supply 2 into 3.3V and 1.8V voltages, and provides them to the space under test IO and cores of processor 7. The processor current monitoring module 13 realizes the current monitoring of the 1.8V voltage of the core of the tested processor 7. When the program is running normally, the current is about 200-400 milliamperes. If it is greater than this operating current, it means that the tested space processor 7 starts If there is a latch phenomenon, it is necessary to cut off the working power supply 2 in time.

[0071] Before performing various tests on the processor, the processor serial port and various registers must be initialized first, and then the serial port outputs 0x55 aa.

[0072] The implementation of the register file test program:

...

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Abstract

The invention discloses a neutron effect test system for an SPARC architecture spatial processor. The system comprises an upper computer, an external power supply, an oscilloscope, a monitoring control panel, a signal connection flexible printed circuit and a tested spatial processor, wherein the upper computer, the external power supply, the oscilloscope and the monitoring control panel are placed in a monitoring room, the tested spatial processor is placed on a circuit board, and the tested spatial processor and the circuit board are placed in an irradiation region in a neutron test reactor together. Programs on the monitoring control panel include an initialization program, a register file test program, a mathematical calculation test program and an instruction and data Cache test program and are used for realizing initialization, register file testing, mathematical calculation testing and instruction and data Cache testing of the tested spatial processor. Through the system, evaluation of neutron effect performance of the SPARC architecture spatial processor is realized.

Description

technical field [0001] The invention relates to a neutron effect test system for a space processor with a SPARC structure, and belongs to the field of neutron effect tests for microprocessors. Background technique [0002] The single event effect refers to the flipping, locking, burning and other phenomena caused by the action of a single high-energy particle on the semiconductor device. The single event effects induced in the aerospace field are mainly protons and heavy particles, while the high-energy particles that induce single event effects in the aerospace field are neutrons. Since neutrons have no charge, they have strong penetrating ability, and metal materials have almost no effect on them. Any blocking effect, neutrons will directly penetrate the engine room and hit the central controller or key data storage of various electronic equipment, resulting in single-event effects of neutrons, which will cause software and hardware errors, and even lead to the occurrence ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/22G01R31/00
CPCG01R31/003G06F11/2205G06F11/2226G06F11/2236G06F11/2273
Inventor 祝长民陈雷聂伟丽兰利东简贵胄韩逸飞王建永周海洋刘立全陆振林任永正郑宏超王枭鸿王猛
Owner BEIJING MXTRONICS CORP
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