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A method for testing a display substrate and a substrate applied to a display device

A technology for displaying substrates and display devices, which is applied to static indicators, instruments, etc., and can solve problems such as too many wires

Active Publication Date: 2020-09-04
TCL CHINA STAR OPTOELECTRONICS TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The present invention mainly provides a method for testing a display substrate and a substrate applied to a display device, so as to solve the problem of ESD caused by the excessive number of crossing lines in the test circuit on the periphery of the combined display substrate in the prior art. question

Method used

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  • A method for testing a display substrate and a substrate applied to a display device
  • A method for testing a display substrate and a substrate applied to a display device
  • A method for testing a display substrate and a substrate applied to a display device

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Embodiment 1

[0021] see figure 1 with image 3 , figure 1 It is a partial structural schematic diagram of an implementation manner of a substrate applied to a display device in this embodiment, image 3 It is a schematic layout diagram of an implementation mode of the substrate applied to the display device in this embodiment. from figure 1 with image 3 It can be seen that a substrate applied to a display device of the present invention includes:

[0022] The substrate body 500 has a plurality of combined display substrates 100 arranged in a matrix formed on one surface thereof, each of the combined display substrates 100 includes a larger display substrate 12 and a smaller display substrate 11 combined with each other, and each of the combined display substrates A test line is provided in the peripheral area of ​​100 , and the test line includes a film-forming guaranteed area 200 and a non-film-forming guaranteed area 300 .

[0023] Wherein, the test traces and test jumpers 13 c...

Embodiment 2

[0032] see figure 2 with image 3 , figure 2 It is a partial structural schematic diagram of an implementation manner of a substrate applied to a display device in this embodiment, image 3 It is a schematic layout diagram of an implementation mode of the substrate applied to the display device in this embodiment. from figure 2 with image 3 It can be seen that a substrate applied to a display device of the present invention includes:

[0033]The substrate body 500 has a plurality of combined display substrates 100 arranged in a matrix formed on one surface thereof, each of the combined display substrates 100 includes a larger display substrate 22 and a smaller display substrate 21 combined with each other, each of the combined display substrates A test line is provided in the peripheral area of ​​100 , and the test line includes a film-forming guaranteed area 200 and a non-film-forming guaranteed area 300 .

[0034] Wherein, the test traces and test jumpers 23 corres...

Embodiment 3

[0045] see image 3 with Figure 4 , image 3 It is a schematic layout diagram of an embodiment of the display substrate of the present invention, Figure 4 It is a flow chart of some implementation steps of an implementation mode of the display substrate testing method of this embodiment. from Figure 4 It can be seen that a method for testing a display substrate of the present invention includes the following steps:

[0046] Step S101: Provide a substrate body 500, a surface of the substrate body 500 is formed with a plurality of combined display substrates 100 arranged in a matrix, and each of the combined display substrates 100 includes a larger display substrate and a smaller display substrate combined with each other , each of the combined display substrates 100 is provided with a test line in the peripheral area, and the test line includes a film-forming guarantee area 200 and a non-film-forming guarantee area 300, wherein the test lines and test lines corresponding...

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Abstract

The invention discloses a display substrate testing method and a substrate applied to a display device. The substrate applied to the display device comprises a substrate body. A number of combined display substrates are formed on one surface of the substrate body. Each combined display substrate comprises a large display substrate and a small display substrate. A test line is arranged in the peripheral region of the combined display substrates. The test line comprises a film forming guarantee region and a non-film forming guarantee region. A test routing and test overline crossing compact region corresponding to different display substrates is arranged in the film forming guarantee region. According to the invention, the problem of electrostatic discharge caused by test overline and test routing crossing wiring is reduced.

Description

technical field [0001] The invention relates to the field of liquid crystal displays, in particular to a method for testing a display substrate and a substrate applied to a display device. Background technique [0002] Thin Film Transistor Liquid Crystal Display (TFT-LCD for short) is an important flat-panel display device. Its main structure is an array substrate and a color filter substrate arranged in a pair of boxes, and filled in the array substrate and color filter substrate. between the liquid crystal layers. Gate lines and data lines and pixel units defined by the gate lines and data lines are formed on the array substrate, and each pixel unit includes a thin film transistor (Thin Film Transistor, TFT for short) and a pixel electrode. During the display process, the TFT is used as a switch to control the application of a driving electric field to the liquid crystal, thereby controlling the rotation of the liquid crystal and realizing the display of the screen. Usua...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G09G3/00
CPCG09G3/006
Inventor 彭邦银
Owner TCL CHINA STAR OPTOELECTRONICS TECH CO LTD