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Trench heat dissipation structure for semiconductor devices

A heat-dissipating structure and semiconductor technology, applied in semiconductor devices, semiconductor/solid-state device parts, electric solid-state devices, etc., can solve the problems of insufficient heat dissipation design and difficult heat dissipation.

Active Publication Date: 2019-11-19
REALTEK SEMICON CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The effect of the above heat dissipation design decreases with the evolution of the semiconductor manufacturing process. For advanced manufacturing processes (such as 55 nm or below), due to smaller transistors, they are more concentrated (more transistors per unit area) The number of transistors) and the smaller metal line width and line spacing make it difficult to dissipate heat, which gradually makes these heat dissipation designs insufficient.

Method used

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  • Trench heat dissipation structure for semiconductor devices
  • Trench heat dissipation structure for semiconductor devices
  • Trench heat dissipation structure for semiconductor devices

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Embodiment Construction

[0044] The technical terms in the following explanations refer to the customary terms in this technical field. If some terms are explained or defined in this specification, the explanations or definitions of these terms shall prevail in this specification. In addition, on the premise that implementation is possible, the meaning of the relative relationship between objects described in this specification may include direct or indirect relationship. The so-called "indirect" refers to the existence of intermediate objects or physical spaces between objects.

[0045] The present invention includes a trench heat dissipation structure for semiconductor devices. The heat dissipation structure belongs to the level of integrated circuits, can directly dissipate heat for integrated circuits, and effectively solves the problem of advanced semiconductor manufacturing processes (such as processes of 55 nanometers or less) The heat dissipation problem can be applied to a three-dimensional in...

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Abstract

The invention discloses a trench type heat dissipation structure used for a semiconductor apparatus. According to an embodiment, the trench type heat dissipation structure comprises a first semiconductor substrate, a heat source, at least one first heat conducting layer, at least one first heat conductor, at least one heat dissipation trench, and at least one second heat conducting structure, wherein the heat source is positioned on or belongs to the first semiconductor substrate, and comprises at least one hot spot; the at least one first heat conductor is used for connecting the at least one hot spot and the at least one first heat conducting layer; and the at least one second heat conducting structure is used for connecting the at least one first heat conducting layer and the at least one heat dissipation trench, so that the heat of the heat source is conducted to the heat dissipation trench.

Description

technical field [0001] The present invention relates to heat dissipation structures, in particular to heat dissipation structures for semiconductor devices. Background technique [0002] Semiconductor devices generate heat during operation, so a heat dissipation design is required to prevent operation from being affected. At present, the heat dissipation design of semiconductor devices mostly belongs to the package level or printed circuit board level. The heat dissipation design at the package level usually uses an external heat sink to dissipate heat from the packaged semiconductor device, while the heat dissipation design at the printed circuit board level usually uses The heat dissipation device is used to dissipate heat as a whole on the printed circuit board provided with the semiconductor device. The effect of the above heat dissipation design decreases with the evolution of the semiconductor manufacturing process. For advanced manufacturing processes (such as 55 nm ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L23/367
CPCH01L23/367
Inventor 颜孝璁简育生叶达勋
Owner REALTEK SEMICON CORP