Exposure device and exposure method thereof
A kind of equipment and technology to be exposed, which can be used in microlithography exposure equipment, optomechanical equipment, photolithographic process exposure devices, etc., and can solve problems such as alignment accuracy problems
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[0045] The specific implementation manners of the exposure equipment and the exposure method provided by the embodiments of the present invention will be described in detail below with reference to the accompanying drawings.
[0046] The shape and size of each film layer in the drawings do not reflect the real scale, and the purpose is only to illustrate the content of the present invention.
[0047] An exposure device based on the Taber effect provided by an embodiment of the present invention, such as Figure 2a to Figure 6 As shown, it includes: a machine platform 100 for placing the substrate to be exposed, a mask plate 200 arranged above the machine platform 100 and having a periodic pattern, an exposure light source 300 arranged above the mask plate 200 and emitting a set wavelength, and The exposure light source 300 exposes the transparent body 400 that moves horizontally in the exposure area A between the mask plate 200 and the machine 100 in a set direction;
[0048]...
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