A kind of exposure equipment and exposure method thereof
A kind of equipment and technology to be exposed, which can be used in microlithography exposure equipment, optomechanical equipment, photolithographic process exposure devices, etc., and can solve problems such as alignment accuracy problems
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[0045] The specific implementations of the exposure apparatus and the exposure method thereof provided by the embodiments of the present invention will be described in detail below with reference to the accompanying drawings.
[0046] The shapes and sizes of the film layers in the accompanying drawings do not reflect the actual scale, and are only intended to illustrate the content of the present invention.
[0047] The embodiment of the present invention provides an exposure device based on the Taber effect, such as Figure 2a to Figure 6 As shown, it includes: a machine 100 for placing the substrate to be exposed, a mask 200 arranged above the machine 100 and having a periodic pattern, an exposure light source 300 arranged above the mask 200 and emitting a set wavelength, and The transparent body 400 that moves horizontally in the set direction in the exposure area A between the mask plate 200 and the machine 100 when the exposure light source 300 exposes; wherein,
[0048]...
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