Test launch and control system

Abstract

A test launch and control system disclosed by the application is characterized in that the first input end and the second input end of a main control circuit are connected with the output ends of a test control terminal and a launch control terminal respectively, and the first output end is connected with the input end of a circuit system on a launch object; the main control circuit is used to generate a test/launch control signal according to a test/launch instruction sent by the test/launch control terminal and send to the circuit system, thereby carrying out the ground/launch test on the launch object, wherein the main control circuit comprises a main control chip circuit and a time delay output circuit, the first input end and the second input end of the main control chip circuit are used as the first input end and the second input end of the main control circuit respectively, the output end of the main control chip circuit is connected with the input end of the time delay output circuit, and the first output end of the time delay output circuit is used as the first output end of the main control circuit. According to the application, by utilizing the time delay output circuit, the situation that an unstable signal outputted by a main control chip during the electrification and reset period causes the misoperation of the launch object, is avoided, and the safety and the reliability can be improved effectively.

Description

technical field [0001] The present application relates to the technical field of test launch research, in particular to a test launch control system. Background technique [0002] The test launch control system is a general term for ground testing and launch testing of rockets, rockets and other launching objects. It is widely used in aerospace, meteorological detection, space detection and other fields. [0003] With the advancement of the times and technology, modern society has higher and higher requirements for the reliability and safety of the test launch control system. Since the test launch control system is generally used in high-cost, high-tech, and high-risk research fields, it is an important part of testing research results and has a heavy responsibility. Therefore, the reliability and safety of the test launch control system must not be compromised. However, in the prior art, due to the inherent defect of the hardware circuit in the test launch control system, ...

AI Technical Summary

Problems solved by technology

However, in the prior art, due to the inherent defect of the hardware circuit in the test launch control system, that is, the output signal of the main control chip is unstable within a certain period of time after the power-on reset, the test launch control system may be on the main control chip. During the power-on reset period, a malfunction signal occurs, which makes the circuit system on the transmitting object unexpectedly powered on, resulting in potential safety hazards

Images