A coffin-mason-based LED lead life prediction method and testing device
A life prediction and lead-in technology, which is applied in the direction of measurement devices, single semiconductor device testing, and electrical measurement, can solve the problems of time-consuming and troublesome, difficult to guarantee the reliability of simulation results, etc., achieve high prediction accuracy, high efficiency of life prediction, and improve efficiency effect
Active Publication Date: 2020-09-04
CHANGZHOU INST OF TECH RES FOR SOLID STATE LIGHTING
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[0002] With the popularization and wide application of LEDs, its reliability has gradually become a research point, and the failure of gold leads in formal LED devices has always been an important negative factor restricting the life of such devices. Traditional rapid life prediction methods, such as accelerated Although the prediction of the experiment is more accurate, it is time-consuming and troublesome, and it is difficult to guarantee the reliability of the simulation results alone. Therefore, this paper takes into account the reliability of the accelerated experiment and the convenience of the simulation calculation, and introduces a faster power cycle accelerated life prediction method, which can be quickly and effectively Predict the actual life of the leads, and the error is within 3%, so this method has broad application prospects in the reliability research of high-power front-mount LED packaging devices
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[0037] In order to make the technical solutions of the present invention clearer and clearer to those skilled in the art, the present invention will be further described in detail below in conjunction with the examples and accompanying drawings, but the embodiments of the present invention are not limited thereto.
[0038] Such as figure 1 As shown, a Coffin-Mason-based LED lead life prediction method provided in this embodiment, increases the power cycle load in the accelerated life test, obtains the plastic strain amplitude of the gold lead through finite element simulation calculation, and then combines temperature and current to accelerate aging Test, fit the coffin-mason formula of the LED sample, calculate the two coefficients in the coffin-mason formula, and obtain the relationship curve between the life of the lead wire and the strain amplitude of the lead wire under different working conditions, and then perform power analysis on the samples under different conditions....
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The invention discloses a Coffin-Mason based LED lead service life forecasting method and belongs to the technical field of LED testing. Power cyclic loading is added in an acceleration service life test. Metal lead plastic strain amplitude is acquired through finite element simulating calculation. Then a Coffin-Mason formula of a sample is obtained through fitting through combination with temperature and current accelerated aging tests, and a relation curve of lead service life and strain amplitude in different working conditions of the lead is obtained. Power circulation simulation calculation is performed on the sample in different conditions and strain amplitude is obtained. The actual service life of the lead is forecasted according to the formula. According to the invention, service forecasting of chips in different working conditions in an aspect of metal lead fatigue failure can be realized. The service life forecasting efficiency is high and the forecasting accuracy is high. A power circulation power supply factor is introduced, so that efficiency of aging tests and pre-fitting of the service life forecasting empirical formula is improved.
Description
technical field [0001] The invention relates to a LED lead wire life prediction method and a test device, in particular to a Coffin-Mason-based LED lead wire life prediction method and a test device, belonging to the technical field of LED testing. Background technique [0002] With the popularization and wide application of LEDs, their reliability has gradually become a research point, and the failure of gold leads in formal LED devices has always been an important negative factor restricting the life of such devices. Traditional rapid life prediction methods, such as accelerated Although the prediction of the experiment is more accurate, it is time-consuming and troublesome, and it is difficult to guarantee the reliability of the simulation results alone. Therefore, this paper takes into account the reliability of the accelerated experiment and the convenience of the simulation calculation, and introduces a faster power cycle accelerated life prediction method, which can be...
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IPC IPC(8): G01R31/26G06F30/23
CPCG01R31/2601G06F30/23
Inventor 李磊钱诚樊嘉杰樊学军张国旗
Owner CHANGZHOU INST OF TECH RES FOR SOLID STATE LIGHTING