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System for improving test capability of free space method

A technology of free space and capacity, which is applied in the system field of improving the test capacity of the free space method, so as to avoid local bending and reduce test errors

Inactive Publication Date: 2018-03-09
SICHUAN LAIYUAN TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] However, the free space method also has testing defects, and its testing ability needs to be improved.

Method used

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  • System for improving test capability of free space method

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Experimental program
Comparison scheme
Effect test

Embodiment 1

[0024] Such as figure 1 As shown, the system for improving the test capability of the free space method includes a receiving antenna, a test sample rack 6, a vector network analyzer 7 and a transmitting antenna, the test sample rack 6 is arranged in the middle position between the receiving antenna and the transmitting antenna, and the receiving antenna and The transmitting antennas are all horn antennas and have the same structure, the horn mouth of the receiving antenna and the horn mouth of the transmitting antenna are all facing the test sample frame 6, the waveguide section 1 of the receiving antenna is connected with the vector network analyzer 7, the waveguide section 1 of the transmitting antenna and the The vector network analyzer 7 is connected, the test sample rack 6 is a rectangular frame structure and the lower end of the test sample rack 6 is fixed on a base 8 .

[0025] Due to the large area of ​​the sample, there will be a curved part above the sample, and this...

Embodiment 2

[0027] The transmitting antenna includes a waveguide section 1 and a horn section 3, the waveguide section 1 and the horn section 3 are connected, the waveguide section 1 has a waveguide cavity 5, and the upper and lower walls of the waveguide cavity 5 are respectively distributed with 2-3 ridge structures 2. The transmitting antenna adopted in the invention can load the waveguide, reduce the cut-off frequency and increase the working bandwidth of the waveguide, and can improve the test range.

[0028] A transition cavity 4 is also arranged in the waveguide section 1 , and the transition cavity 4 is arranged between the waveguide cavity 5 and the horn section 3 .

[0029] The ridge structure 2 extends into the transition chamber 4 .

[0030] An annular protrusion is arranged in the transition cavity 4 .

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Abstract

The invention discloses a system for improving the test capability of a free space method. The system comprises a receiving antenna, a test sample frame, a vector network analyzer and a transmitting antenna, wherein the test sample frame is arranged between the receiving antenna and the transmitting antenna, the receiving antenna and the transmitting antenna are horn antennas and identical in structure, and the horn mouth of the receiving antenna and the horn mouth of the transmitting antenna are aligned with the test sample frame; a waveguide section of the receiving antenna is connected withthe vector network analyzer, a waveguide section of the transmitting antenna is connected with the vector network analyzer, the test sample frame is of a rectangular framework structure, and the lower end of the test sample rack is fixed to a base. According to the system, the test sample rack is arranged to be of the rectangular framework structure, that is, when a sample is placed in the test sample rack, the test sample rack contains the test sample like a covering edge, local bending of the test sample is avoided, and test errors are reduced.

Description

technical field [0001] The invention relates to the field of antennas, in particular to a system for improving the test capability of the free space method. Background technique [0002] The free space method is an open-field electromagnetic characteristic parameter testing technology, which belongs to the transmission / reflection method. This method was first introduced by Cullen A L using the Fresnel formula to measure the electromagnetic parameters of materials in free space. The free space method has lower requirements on the sample, and only needs a large enough flat plate with two parallel sides, because it can reduce the diffraction of the external environment and the diffuse reflection caused by the uneven surface. The sample of the free space method is convenient to place, and overcomes the gap problem in the coaxial line method and the rectangular waveguide method in the closed field. In addition to this, this method has the following advantages: [0003] (1) The...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R29/08
CPCG01R29/0821G01R29/0878
Inventor 阳安源
Owner SICHUAN LAIYUAN TECH CO LTD