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Measuring instrument calibration method based on embedded system

A technology of embedded systems and measuring instruments, applied in the fields of instruments, computing, computer security devices, etc., can solve problems such as the inability to calibrate measuring instruments, and achieve the effect of rapid judgment

Inactive Publication Date: 2018-03-13
CHANGSHA UNIVERSITY OF SCIENCE AND TECHNOLOGY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The purpose of the present invention is to provide a method for calibrating measuring instruments based on an embedded system to solve the problem in the prior art that the measuring instruments cannot be calibrated

Method used

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  • Measuring instrument calibration method based on embedded system
  • Measuring instrument calibration method based on embedded system
  • Measuring instrument calibration method based on embedded system

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Embodiment Construction

[0027] The embodiments of the present invention will be described in detail below with reference to the accompanying drawings, but the present invention can be implemented in many different ways defined and covered by the claims.

[0028] The invention provides a measuring instrument based on an embedded system, see figure 1 , including a measuring instrument 1 and a measuring instrument calibration device 2, the measuring instrument calibration device 2 includes a reading module 22, a communication module 23, a storage module 24 and a processing module 21, and the reading module 22 is connected with the measuring instrument 1 to read the measuring instrument 1 code data, the communication module 23 is respectively connected to the processing module 21, the storage module 24, and the external disassembly device 3, and the storage module 24 is connected to the processing module 21.

[0029] The disassembly device 3 is connected with the communication module 23, reads the code d...

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Abstract

The invention discloses a measuring instrument calibration method based on an embedded system, relates to the field of measuring instrument calibration, and aims at solving the technical problem in the prior art that a measuring instrument cannot be calibrated. The method comprises the steps of obtaining original code data when a measuring instrument leaves factory through a measuring instrument calibration device; conducting disassembling processing on the original code data of the measuring instrument through a disassembling device to obtain original assembly codes; sending the original assembly codes to the measuring instrument calibration device to be stored to judge the accuracy of real-time code data when the measuring instrument is in use. Whether target codes are falsified or not is judged by comparing original codes of the measuring instrument with target codes of the to-be-calibrated measuring instrument, and thus the calibration result of the measuring instrument is obtained.

Description

technical field [0001] The invention relates to the field of measuring instrument calibration, in particular to a method for calibrating measuring instruments based on an embedded system. Background technique [0002] All measuring instruments must be used under the condition of qualified calibration. After a long period of use, the equipment will wear out and cause measurement errors or other human factors will cause measurement errors. The impact of measurement errors on product quality can be avoided by calibrating the measuring instruments. Regular calibration or verification of monitoring equipment or appliances is one of the quality control points. Take the calculation of the distance of a taxi that is more common in our life as an example. If a certain type of taxi turns 500 times and the distance is calculated as 1 kilometer, this data calculation is written in the metering embedded system program. The relevant data in the system is modified to 450 laps as 1 kilome...

Claims

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Application Information

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IPC IPC(8): G06F21/57G01D18/00
CPCG01D18/00G06F21/572
Inventor 傅明陈锦蓉曾勇曹敦
Owner CHANGSHA UNIVERSITY OF SCIENCE AND TECHNOLOGY