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Lithium battery charging device test circuit and test method in sp8 package form

A test method and test circuit technology, applied in the field of test circuits, can solve the problems of limited use of special test instruments and long development cycle of special test instruments, and achieve the effects of increasing capacity, improving test accuracy and increasing reliability

Active Publication Date: 2020-04-10
JIANGSU YOURUN MICROELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to the limitations of special test instruments, non-standardization and the long development cycle of special test instruments, the use of special test instruments has been greatly restricted.

Method used

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  • Lithium battery charging device test circuit and test method in sp8 package form

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Experimental program
Comparison scheme
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Embodiment Construction

[0059] Such as figure 1 A lithium battery charging device test circuit in an SP8 package as shown, including a plurality of detection terminals connected to the device under test and a peripheral circuit cooperating with the detection terminals;

[0060] The detection terminal is used to input the voltage and current signal to the device under test, and simultaneously detects the voltage and current signal fed back by the device. The detection terminal includes a terminal PVI0 connected to the VIN pin of the device under test, a terminal DVI2 connected to the TS pin of the device under test, and a The terminal DVI1 of the CHRG pin of the device under test, the terminal DVI5 connected with the EN pin of the device under test, the terminal DVI3 connected with the CS pin of the device under test, and the terminal PVI1 connected with the VOUT pin of the device under test, the detection terminal also includes a frequency detection terminal Terminal QTMU0, the terminal QTMU0 is conn...

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PUM

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Abstract

The invention discloses an SP8 encapsulation type lithium battery charging device test circuit comprising a peripheral circuit that is connected to a plurality of detection terminals connected to a to-be-tested device and cooperates with the detection terminals. The detection terminals are used for inputting voltage and current signals into the to-be-tested device and detecting voltage and currentsignals fed back by the device. The detection terminals consist of a terminal PVI0 connected to a VIN pin of the to-be-tested device, a terminal DVI2 connected to a TS pin of the to-be-tested device,a terminal DVI1 connected to a CHRG pin of the to-be-tested device, a terminal DVI5 connected to an EN pin of the to-be-tested device, a terminal DVI3 connected to a CS pin of the to-be-tested device, and a terminal PVI1 connected to a VOUT pin of the to-be-tested device. With the test circuit and the test method, the precision of testing of a 6038 device is improved substantially; the yield of the device is increased; and the production efficiency is enhanced. The test circuit and the test method can be applied to the 6038 device testing.

Description

technical field [0001] The invention relates to a test circuit, in particular to a lithium battery device test circuit. Background technique [0002] With the development of the integrated circuit industry, it is becoming more and more important to test the integrated circuit. For now, integrated circuit tests generally use special test instruments and general test instruments. Due to the limitations, non-standardization and long development cycle of special testing instruments, the use of special testing instruments has been greatly restricted. Universal test equipment (ATE: Automatic test equipment) has quickly become the mainstream of the integrated circuit testing industry due to its versatility, standardization, convenience and openness. [0003] The HX6038 device is a highly advanced and complete constant current, constant voltage, constant linear charging chip, Li-ion battery charger. Due to the 6038's SMD package shape and few external components, it is an ideal c...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28G01R31/52G01R31/54
CPCG01R31/2884G01R31/2896G01R31/50
Inventor 张海民石华平陈德林陈婷婷范荣荣
Owner JIANGSU YOURUN MICROELECTRONICS CO LTD