Test method for anti-single event flip fault of spaceborne software based on erc32
An anti-single-event, testing method technology, applied in software testing/debugging, program code conversion, error detection/correction, etc., can solve problems such as the inability to stably and reliably test the anti-single-event overturn fault function of on-board software, and achieve good results. The effect of engineering application value
Active Publication Date: 2021-05-11
SHANGHAI SPACEFLIGHT INST OF TT&C & TELECOMM
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[0006] The purpose of the present invention is to provide a test method for ERC32-based on-board software anti-single event upset failure, to solve the problem that the existing technology cannot stably and reliably test the anti-single event upset function of on-board software
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[0035] The technical solutions in the embodiments of the present invention will be clearly and completely described and discussed below in conjunction with the accompanying drawings of the present invention. Obviously, what is described here is only a part of the examples of the present invention, not all examples. Based on the present invention All other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.
[0036] In order to facilitate the understanding of the embodiments of the present invention, specific embodiments will be taken as examples for further explanation below in conjunction with the accompanying drawings, and each embodiment does not constitute a limitation to the embodiments of the present invention.
[0037] The ERC32-based on-board software test method for anti-single event upset fault provided in this embodiment, the method runs on the ERC32 on-board software test pl...
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The invention provides a test method for ERC32-based on-board software anti-single event flip fault, which runs on the ERC32 on-board software test platform, specifically including: using the TESCTR register attached to the ERC32 chip of the test platform, according to the program operating area Features of SRAM Design the function of injecting EDAC one-bit error and two-bit error faults into the SRAM in the program running area; according to the characteristics of the software lock in the program storage area EEPROM, design injects EDAC one-bit error and two-bit error faults into the EEPROM function; finally, the fault injection function module is loaded into the tested on-board software to compile and run, so as to test the effectiveness of the anti-single event function of the on-board software. This method does not need to leave a JTAG interface, does not need a hardware emulator, and only needs to add a piece of software code, so that the on-board software can be reliably and flexibly tested against single event flip failures.
Description
technical field [0001] The invention relates to the technical field related to on-board software fault testing, in particular to an ERC32-based ERC32-based on-board software anti-single event flip fault testing method. Background technique [0002] Aircraft in a complex space environment are extremely vulnerable to the threat of solar wind, space electromagnetic storm, space high-energy particles and cosmic rays, and single event upset failures occur. The embedded software running on it, such as on-board management software and star service software, is the control core of the satellite, which has high requirements for reliability, safety, maintainability and service life, especially in the event of After a single event failure, it should have the ability to self-detect and repair. [0003] However, after the software has designed the self-detection and repair function of single event faults, how to inject single event faults in the development process and verify the correc...
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IPC IPC(8): G06F11/36G06F11/10G06F8/41
CPCG06F8/41G06F11/10G06F11/3668
Inventor 陆灵君胡晓刚胡浩施雯李晓敏
Owner SHANGHAI SPACEFLIGHT INST OF TT&C & TELECOMM