A defect identification method for magneto-optical eddy current imaging detection
Patent Information
- Authority / Receiving Office
- CN Β· China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- UNIV OF ELECTRONICS SCI & TECH OF CHINA
- Publication Date
- 2020-06-23
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Abstract
Description
technical field
[0001] The invention relates to the field of eddy current detection visualization, in particular to a defect identification method for magneto-optical eddy current imaging detection. Background technique
[0002] In the development process of eddy current testing, we have been pursuing the visualization of testing, hoping to understand the form of defects more intuitively through the visualization method. In the research of eddy current visualization, there are eddy current array detection methods, pulsed eddy current thermal imaging detection methods and eddy current magneto-optical detection methods. The research on these methods shows that the magneto-optical eddy current imaging detection is the best of the three methods in terms of accuracy and detection speed, and this imaging method is more intuitive, and the data can be obtained without redundant processing. information. Among them, the signal directly detected by magneto-optic is the magnetic field...