A Normal Incidence Fresnel Optical Characterization Method for Two-dimensional Materials

A two-dimensional material, normal incidence technology, applied in the direction of optics, optical components, instruments, etc., can solve problems such as loss of effectiveness, and achieve the effect of simple derivation process

Active Publication Date: 2019-10-15
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

However, two-dimensional materials are essentially thin films with a thickness of only a few angstroms. If the interface model is used to calculate its optical properties, the traditional optical thin film theory and commercial optical thin film software will lose their effectiveness.

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  • A Normal Incidence Fresnel Optical Characterization Method for Two-dimensional Materials
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  • A Normal Incidence Fresnel Optical Characterization Method for Two-dimensional Materials

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Embodiment Construction

[0052] In order to enable those skilled in the art to better understand the solutions of the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only It is an embodiment of a part of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.

[0053] The terms "first", "second", "third", "fourth" and the like in the description and claims of the present invention and the above drawings are used to distinguish similar objects, but not necessarily to describe specific sequence or sequence. It is to be understood that the terms so used are interchangeable under appropriate ...

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Abstract

The normal-incidence Fresnel optical characterization method for two-dimensional materials provided by the present invention adopts the traditional basic theory of optical thin films-conduction matrix method, introduces the concept of optical admittance, and deduces the absorption, The simple calculation formulas of reflectivity and transmittance, and the derivation process are simple, which is conducive to the application of two-dimensional materials in the field of optoelectronics.

Description

technical field [0001] The invention relates to the fields of optical thin films and two-dimensional materials, in particular to a normal-incidence Fresnel optical characterization method for two-dimensional materials. Background technique [0002] In 2004, two scientists from the University of Manchester, Andre Geim and Konstantin Novoselov, successfully prepared single-layer graphene (thickness 0.335nm), which opened the second A new era of dimensional materials research. Since then, the optical, electrical, and magnetic properties of graphene have been extensively studied. In the study of the optical properties of graphene, two models have been used. One is the film model, that is, graphene is considered as a film, even if its thickness is only as thin as one atomic layer, this model is mainly used to study the optical constants of two-dimensional materials such as graphene; the other is the interface model, that is Taking graphene as an interface or boundary with an i...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G02B1/00G02B27/00
Inventor 王孝东陈波
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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