A 3D Profile Measurement System
A measurement system and three-dimensional profile technology, applied in the field of measurement systems, can solve problems such as limited application scope, inability to reliably measure complex and fine structures, and achieve universal applicability, improved measurement speed, and improved detection effects.
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[0040] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.
[0041] Such as figure 1 Shown is a simplified schematic diagram of an exemplary embodiment of a measurement system according to the present invention. A three-dimensional profile measurement system provided by the present invention, the main part of the measurement system 100 includes a structured light measurement system 1, a top and turntable system 2, a three-dimensional coordinate measurement system 4, a workbench 5, a controller 6, and a data processing and analysis system 7.
[0042] The structured light measurement system 1 is used to realize the high-speed measurement of the complex curved surface of the workpiece 3 . The structured light measurement system 1 is composed of a first structured light probe 1a to a seventh structured light probe 1g, and seven structured light probes are used in this example. Of course, other numbers of structure...
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