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Measuring system for measuring three-dimensional contour of workpiece

A measurement system and three-dimensional profile technology, applied in the field of measurement systems, can solve the problems of inability to reliably measure complex and fine structures, limited application scope, etc., and achieve the effects of universal applicability, improved detection, and improved measurement speed.

Active Publication Date: 2018-11-16
XI AN JIAOTONG UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, since it is still unable to effectively solve the effects of strong reflection and interreflection on the surface of smooth metal workpieces, this type of technology is limited to measuring objects with gentle changes in surface curvature and less influence of highlights and interreflection, and cannot reliably measure complex and fine structures. The scope of application is limited, and it is easily affected by the environment, light, etc.
[0004] In summary, there has always been a contradiction between high-speed measurement and high-precision measurement in this field, especially the high-speed and high-precision measurement of large-scale and complex curved surface workpieces, which is one of the outstanding and bottleneck problems in this field at present.

Method used

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  • Measuring system for measuring three-dimensional contour of workpiece
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  • Measuring system for measuring three-dimensional contour of workpiece

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Embodiment Construction

[0040] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0041] Such as figure 1 Shown is a simplified schematic diagram of an exemplary embodiment of a measurement system according to the present invention. The present invention provides a measurement system for three-dimensional profile measurement of workpieces. The main parts of the measurement system 100 include a structured light measurement system 1, a tip and turntable system 2, a three-coordinate measurement system 4, a workbench 5, and a controller. 6 and data processing and analysis system 7 .

[0042] The structured light measurement system 1 is used to realize the high-speed measurement of the complex curved surface of the workpiece 3 . The structured light measurement system 1 is composed of a first structured light probe 1a to a seventh structured light probe 1g, and seven structured light probes are used in this example. Of course, other nu...

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Abstract

The invention relates to a measuring system for measuring the three-dimensional contour of a workpiece. The measuring system comprises a workbench, a controller and a data processing and analysis system. The system also comprises a structured light measurement system, a tip and turntable system and a three-coordinate measurement system, which are arranged on the workbench. The structured light measurement system is used for measuring the complex curved surface of the workpiece in a high-speed manner; the three-coordinate measurement system is used for measuring the complex fine portion of theworkpiece to ensure obtaining of high-precision and reliable measurement data of the portion, wherein the measurement data of the three-coordinate measurement system is used for establishing a measurement reference of the workpiece; the tip and turntable system is used for clamping the workpiece and driving the workpiece to rotate to obtain measurement data of the workpiece at different angles bycombining the structured light measurement system; and finally, full-profile three-dimensional contour of the workpiece can be obtained by carrying out coordinate system unification on the measurementdata of the three-coordinate measurement system and the structured light measurement system. The measuring system integrates the advantages of high precision and reliability of the three-coordinate measurement system and high measurement speed of the structured light measurement system and the like.

Description

technical field [0001] The invention relates to a measurement system for three-dimensional contour measurement of workpieces. Background technique [0002] With the development of modern advanced manufacturing, aerospace, large-scale energy and power equipment manufacturing and other industries, the size of processed parts, complex surface features, precision requirements, and detection speed all pose challenges to traditional dimensional detection. The three-dimensional measurement technology that emerged at the historic moment can directly obtain the three-dimensional shape information of the measured object through optical, mechanical, electronic and electrical principles, provide more accurate and comprehensive geometric information, and improve the precision evaluation and quality control methods. It is an indispensable and important technology for modern industrial inspection. At the same time, it can be widely used in industrial inspection, product quality control, r...

Claims

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Application Information

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IPC IPC(8): G01B11/25G01B21/00
Inventor 王昭高建民齐召帅黄军辉何曾范邢超
Owner XI AN JIAOTONG UNIV
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