Measuring system for measuring three-dimensional contour of workpiece
A measurement system and three-dimensional profile technology, applied in the field of measurement systems, can solve the problems of inability to reliably measure complex and fine structures, limited application scope, etc., and achieve the effects of universal applicability, improved detection, and improved measurement speed.
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[0040] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.
[0041] Such as figure 1 Shown is a simplified schematic diagram of an exemplary embodiment of a measurement system according to the present invention. The present invention provides a measurement system for three-dimensional profile measurement of workpieces. The main parts of the measurement system 100 include a structured light measurement system 1, a tip and turntable system 2, a three-coordinate measurement system 4, a workbench 5, and a controller. 6 and data processing and analysis system 7 .
[0042] The structured light measurement system 1 is used to realize the high-speed measurement of the complex curved surface of the workpiece 3 . The structured light measurement system 1 is composed of a first structured light probe 1a to a seventh structured light probe 1g, and seven structured light probes are used in this example. Of course, other nu...
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