Test method for nonlinear calibration of time of flight module

A test method and non-linear technology, which is applied in television, electrical components, image communication, etc., can solve the problems of high precision and high cost, and achieve the effect of reducing test cost and improving test efficiency

Inactive Publication Date: 2018-11-23
GOERTEK OPTICAL TECH CO LTD
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Problems solved by technology

[0004] In view of the above problems, the purpose of the present invention is to provide a test method for nonlinear calibration of the depth of field module to solve the problems of high precision and high cost of the calibration method based on the horizontal guide rail depth of field module

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  • Test method for nonlinear calibration of time of flight module

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[0034] In the following description, for purposes of explanation, numerous specific details are set forth in order to provide a thorough understanding of one or more embodiments. It may be evident, however, that these embodiments may be practiced without these specific details.

[0035] In view of the problems of high accuracy and high cost of the existing calibration method based on the horizontal guide rail depth-of-field module proposed above, the present invention provides a test method for nonlinear calibration of the depth-of-field module, which is tested by using three modes of bidirectional calibration. Thereby solving the above-mentioned problems.

[0036] Specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0037] In order to illustrate the test method flow of the nonlinear calibration of the depth of field module provided by the present invention, figure 1 The test method flow of the nonli...

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Abstract

The invention provides a test method for nonlinear calibration of a time of flight (TOF) module. The method adopts three modes of bidirectional calibration for testing, and comprises the steps of setting initial positions of A and B modules, moving a calibration plate with a guide rail according to a preset sampling interval, and separately acquiring image information of the calibration plate by the A and B modules to obtain distance information of a Near mode of the A module and distance information of a Far mode of the B module; reversely moving the calibration plate with the guide rail according to the preset sampling interval, wherein the position where the A module is located is a Far mode thereof, and the position where the B module is located is a Near mode thereof; separately acquiring image information of the calibration plate by the A and B modules to obtain distance information of the Far mode of the A module and distance information of the Near mode of the B module; resetting the initial positions of the A and B modules, and separately acquiring image information of the calibration plate by the A and B modules to obtain distance information of a Mid mode of the A and Bmodules. The method can solve the problems of low precision, high cost and the like of a calibration method based on a horizontal guide rail TOF module.

Description

technical field [0001] The present invention relates to the technical field of depth-of-field modules, and more specifically, to a testing method for nonlinear calibration of depth-of-field modules. Background technique [0002] Due to the influence of the laser emission power, the depth of field module (TOF) will attenuate when testing different distances. Therefore, when testing long and short distances, the phenomenon shown is not a linear relationship. Therefore, when performing distance calibration on the depth of field module, it will also be calibrated in sections, and the distance calibration will be performed in sections, so that the calibration results will be more accurate. [0003] When calibrating the depth of field module, if it is based on the horizontal guide rail, multiple distance points are sampled for distance calibration. Among them, the longer the guide rail is, the higher the flatness requirement is, and the distance error of the depth-of-field module...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04N17/00
Inventor 徐振宾
Owner GOERTEK OPTICAL TECH CO LTD
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