Test device and method for external insulation delay coefficient under vfto and atmospheric overvoltage
A test device, a technology of external insulation, applied in the direction of testing dielectric strength, etc., can solve the problems of inability to test the performance of external insulation, short duration, difficult to capture, etc.
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[0021] The application will be described in detail below in conjunction with the accompanying drawings.
[0022] Such as figure 1 As shown, it is a VFTO and external insulation delay coefficient test device under atmospheric overvoltage provided by this application. see figure 1 , the external insulation delay coefficient test device under VFTO and atmospheric overvoltage comprises: a signal generation controller 1, a double pulse generation device 2, an external insulation test device 3 and an insulation information collection and processing device 4, and the signal generation controller 1 The signal output end of the double pulse generating device 2 is connected to the input end of the double pulse generating device 2, the output voltage of the double pulse generating device 2 is loaded to the external insulation testing device 3, and the insulation information collection and processing device 4 is used to perform collect message.
[0023] The signal generation controller...
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