Method and apparatus for computer-readable storage medium

Abstract

The invention discloses a testing method, a device and a computer-readable storage medium. The computer-readable storage medium comprises the following steps: determining the main functions to be tested in the items to be tested; obtaining a correlation degree between each function except the main function to be tested and the main function to be tested in the item to be tested; according to the obtained correlation degree, N functions other than the main functions to be tested being selected as related functions to be tested, wherein N is an integer greater than or equal to 0. According to the degree of correlation between each function and the main function to be tested, related functions to be tested are selected, in the case that one function is changed or added, the tester does not need to test all other functions, thus shortening the test cycle. At the same time, compared with only testing the changed or added functions, the invention improves the test quality, and therefore, theinvention improves the test efficiency on the premise of guaranteeing a certain test quality.

Description

technical field [0001] The present invention relates to the technical field of testing, in particular to a testing method and device, and a computer-readable storage medium. Background technique [0002] In the process of modifying the BUG, ​​developers often modify the BUG of the A module, but cause new problems in the B module that was originally tested without problems; or add a new C module, but cause the original test without problems. A new problematic situation arises for the problematic D module. [0003] However, sometimes the product iteration cycle is short and frequent. In the short-term test period, testers usually give priority to the newly modified modules or newly added modules, and spend relatively little time re-verifying the old modules, so it is easier to have hidden dangers. . However, if the test time for old modules is increased, it will not only lengthen the test cycle, affect product promotion and release, but also reduce test efficiency and affect...

AI Technical Summary

Problems solved by technology

[0002] In the process of modifying the BUG, ​​developers often modify the BUG of the A module, but cause new problems in the B module that was originally tested without problems; or add a new C module, but cause the original test without problems. The D module of the problem has a new problem situation

[0003] However, sometimes the product iteration cycle is short and frequent. In the short-term test period, testers usually give priority to the newly modified modules or newly added modules, and spend relatively little time re-verifying the old modules, so it is easier to have hidden dangers.

However, if the test time for old modules is increased, it will not only lengthen the test cycle, affect product promotion and release, but also reduce test efficiency and affect product quality

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