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Method for improving testing efficiency of analog quantity Trimming program

A program testing and analog technology, applied in electronic circuit testing, integrated circuit testing, electrical measurement, etc., can solve problems such as time-consuming, and achieve the effect of reducing testing time, reasonable testing methods, and reliable testing results.

Inactive Publication Date: 2018-12-25
SHANGHAI HUALI MICROELECTRONICS CORP
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, this method is relatively time-consuming, especially for the testing requirements of mass-produced products, and timeliness is particularly important

Method used

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  • Method for improving testing efficiency of analog quantity Trimming program
  • Method for improving testing efficiency of analog quantity Trimming program

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Embodiment Construction

[0018] The specific embodiments of the present invention are given below in conjunction with the accompanying drawings, but the present invention is not limited to the following embodiments. Advantages and features of the present invention will be apparent from the following description and claims. It should be noted that all the drawings are in very simplified form and use imprecise ratios, which are only used for the purpose of conveniently and clearly assisting in describing the embodiments of the present invention.

[0019] Please refer to figure 1 , figure 1 Shown is a flow chart of a method for improving the test efficiency of an analog Trimming program in a preferred embodiment of the present invention. The present invention proposes a kind of method that improves analog quantity Trimming procedure testing efficiency, comprises the following steps:

[0020] Step S100: Determine the initial value of the DAC scan according to the tested adjacent chip test information o...

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Abstract

The invention provides a method for improving the testing efficiency of an analog quantity Trimming program. The method comprises the following steps: determining a starting value of a DAC scan according to measured proximity chip test information of a current testing wafer test chip; setting a scanning step value; and starting scanning until the scan is successful or the scan to an extreme valueis determined to fail. According to the method for improving the testing efficiency of an analog quantity Trimming program, the testing method of the chip analog quantity Trimming program is more reasonable, the test result is more reliable, and the test timeliness problem is solved.

Description

technical field [0001] The invention belongs to the field of chip functional testing in the field of microelectronics, and in particular relates to a method for improving the testing efficiency of an analog trimming program. Background technique [0002] When testing a Flash chip, it is often necessary to scan the analog DAC value until a suitable DAC value is found, that is, a trimming test. The method used in the traditional analog trimming test is to uniformly sweep the DAC scan mode of each test chip from 0 to the end value (for example, 31), for example, sweep to the end with the scan step DACstp=1, and scan the minimum value DACmin=0 Take the value DACmax=31 as an example. The method is simple and convenient when writing test programs, and is easy to write, and adopts the same test mode for all test chips. However, this method is relatively time-consuming, especially for the testing requirements of mass-produced products, and timeliness is particularly important. C...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
CPCG01R31/2853G01R31/287
Inventor 朱岚郑鹏飞李强
Owner SHANGHAI HUALI MICROELECTRONICS CORP