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A combined photothermal aging test device for power equipment

A technology of photothermal aging and test device, applied in the direction of measuring device, measuring electricity, measuring electrical variables, etc., can solve the problem of no photothermal aging test device, etc., and achieve the effect of saving energy

Active Publication Date: 2020-11-13
XISHUANGBANNA POWER SUPPLY BUREAU OF YUNNAN POWER GRID CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The object of the present invention is to provide a combined photothermal aging test device for electric power equipment, to solve the problem that there is no test device for photothermal aging in the above-mentioned background technology

Method used

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  • A combined photothermal aging test device for power equipment
  • A combined photothermal aging test device for power equipment
  • A combined photothermal aging test device for power equipment

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0029] see Figure 1~6 , the present invention provides a technical solution: a combined photothermal aging test device for power equipment, including a test signal generation source, a photothermal aging device, a current sensor, a voltage sensor, an acquisition system and a microprocessor, the microprocessor The data signal connection between the device and the test signal generation source, the photothermal aging device, the current sensor, the voltage sensor, and the acquisition system; the photothermal aging device includes a base 1, and the top of the base 1 is fixed with a first support column by screws 2. The top of the first support column 2 is welded with an equipment support plate 3, and the top left side of the base 1 is fixed with a second support column 5 by screws, and the top of the second support column 5 is hinged to the first concave surface The outer side of the concentrator 8, the outer side of the second support column 5 is welded with a first beam 6, the...

Embodiment 2

[0041] Embodiment 2 Electrothermal aging test

[0042] The test equipment is a 10kV cable, the test signal generator provides a voltage of 10kV, 50Hz, and the far end of the cable is connected to a 2k ohm load. The cable length is 50 meters, and the cable is passed through the transparent box body 24 at the middle position, and the temperature of the transparent box body is adjusted to 150 degrees, and the setting time is 60 minutes.

[0043] The acquisition system collects the loop current through the core current transformer, collects the cable terminal voltage through the step-down voltage converter, and records the waveform value, effective value, and phase of current and voltage. Assume that the acquisition system collects data once every 5 minutes to obtain the phase-time characteristic curve, see Figure 7 .

[0044] Since the temperature applied by high temperature aging is the limit temperature of the cable, the local aging of the cable will be intensified. If one h...

Embodiment 3

[0045] Embodiment 3 Photo-electricity-thermal aging test

[0046] The test equipment is a 10kV cable, and the test signal generator provides a voltage of 10kV, 50Hz. In this test, a photothermal aging heating with a length of 3 meters is carried out at a distance of 60 meters of cable. The concentrating power of the concentrator is set to 20 times, and the surface temperature of the cable at the concentrating position reaches 150 degrees. Such as Figure 8 As shown, under the effect of spotlight, after the same 60 minutes, even if only the 3-meter-long cable is heated in the spotlight mode, the influence on the overall impedance angle is very obvious. When other conditions are the same as the experimental conditions of Example 2, the obtained impedance angle curve is tested.

[0047] Such as Figure 8 As shown, under the effect of spotlight, after the same 60 minutes, even if only the 3-meter-long cable is heated in the spotlight mode, the influence on the overall impedanc...

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Abstract

The invention aims at the conditions that the aging simulation test for the power equipment is electric aging or thermal aging currently, and there is no test device for the light-heat aging, but in the actual operation, most of power equipment are located in the outdoor sunlight environment and are affected by the visible light and ultraviolet light, so the aging of the power equipment is quickerthan the simple electric aging. The invention discloses a combined testing device for light-heat aging of power equipment, and the device comprises a test signal generation source, a light-heat agingdevice, a current sensor, a voltage sensor, and a microprocessor. The light-heat aging device can gather natural light through the setting of a first concave surface condenser to perform the aging test, thereby saving the energy. The device isolates to-be-tested equipment through a transparent box body, and can start the heating and focusing testing at the same time through the setting of an ultraviolet light, and also can perform the independent measurement. The ultraviolet light and the visible light can be freely switched. According to the scheme of the invention, the device fills a technical gap to a certain degree.

Description

technical field [0001] The invention relates to the technical field of test device aging test equipment, in particular to a combined photothermal aging test device for power equipment. Background technique [0002] The aging test project refers to the process of simulating the various factors involved in the actual use conditions of the product to carry out corresponding condition strengthening experiments on the aging of the product. This experiment is mainly aimed at plastic materials. The common aging mainly includes light aging, damp heat aging, Hot air aging. [0003] At present, the aging simulation tests for power equipment are mainly electrical and thermal aging. However, in actual operation, most power equipment is exposed to outdoor sunlight. Affected by visible light and ultraviolet rays, the aging of power equipment is faster than simple electrical aging. At present, there is no test device for photothermal aging, and the scheme proposed in this patent fills the...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00G01N17/00
CPCG01N17/002G01N17/004G01R31/003
Inventor 田军明刘潇詹红生李胜马玉珠方堃吴猛陈勇慎赵霞孙云川王伟张清涛
Owner XISHUANGBANNA POWER SUPPLY BUREAU OF YUNNAN POWER GRID CO LTD
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