An array substrate, its testing method, a display panel and a display device

Abstract

The invention discloses an array substrate and a test method thereof, a display panel and a display device. The array substrate comprises N data input lines, N data signal input terminals which are respectively connected to the data input lines, a test control terminal, N test modules which are in one-to-one correspondence with the data input lines, and a first test signal output terminal, whereinthe Mth test module is used for providing a signal loaded on the Mth data input line for the first test signal output terminal under the control of a signal loaded on the test control terminal and asignal loaded on the M+1th data input line. According to the structure, each data input line can be independently tested, and test equipment is connected at the first test signal output terminal, so that the signal of each data input line can be tested. The electrical test of the data input line is not limited by a test position, the test method is simple and rapid, and the damage to an insulatinglayer on the array substrate is not needed.

Description

technical field [0001] The present invention relates to the field of display technology, in particular to an array substrate, a testing method thereof, a display panel and a display device. Background technique [0002] With the continuous innovation of display technology, the display panel manufacturing process is becoming more and more refined, and the line width requirements of the signal lines in the display panel are becoming more and more fine. Due to the increase in the complexity of the manufacturing process, there may be many defects in the finished display panel, resulting in these The cause of the defect may be abnormal output of the display chip, damage to the line in the fan-out area, damage to the data selector (Multiplexer), damage to the line in the display area, or abnormality in the electrostatic protection circuit. The above-mentioned reasons all need to use the signal of the test data line as the analysis basis. [0003] At present, there are two ways to...

AI Technical Summary

Problems solved by technology

[0003] At present, there are two ways to test the data signal line of the display panel. The first is to make a dummy data signal line (Dummy Source) and connect the test terminal to test the signal of the simulated data signal line. It can test the signal of the surrounding data signal line, but cannot test all the lines in the display panel

The second is to use a laser probe station to remove the insulation layer on the data signal line with laser bombardment, and then use the probe to connect to an oscilloscope for testing, but this test method is a destructive test, and the success rate is less than 70%.

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