A self-testing device supporting full card radio-frequency test and a using method thereof relate to the technical field of non-contact IC cards. The self-testing device comprises a full card supporting a self-testing function, a testing bench, and a testing software platform, all of which are connected together in sequence. The full card comprises an antenna network, an NFC chip, and a CPU intelligent card. The self-testing device is structurally characterized in that the NFC chip comprises a receiving unit, a transmitting unit, an antenna unit, a power unit, a phase-locked loop unit, a control unit, a memory cell, an interface unit, and an automatic test assisting unit. The receiving unit, the phase-locked loop unit, the transmitting unit and the antenna unit are connected sequentially into a loop to form a radio frequency unit. The radio frequency unit sends and receives signals according to the ISO 14443/FeliCa protocol standard. The control unit is connected with the receiving unit, the phase-locked loop unit, the transmitting unit, the automatic test assisting unit, the memory cell, the interface unit and the power unit. By adopting the self-testing device, the testing time for in-batch full card testing can be reduced. The self-testing device has characteristics of simple test and low cost.